Inventor · disambiguated record
Hisayasu Nishino
Also filed as: NISHINO HISAYASU
8 granted patents·188 citations·filing 1992–1997
89Inventor score
Technology areasH01J
Files withFUJITSU LTD8
Top patents by PatentIndex Score
8 records- 0186US5399872ACharged-particle beam exposure methodFUJITSU LTD·Filed 1993·Granted Mar 21, 1995·51 cites·7 claims
- 0283US5719402AMethod of and system for charged particle beam exposureFUJITSU LTD·Filed 1996·Granted Feb 17, 1998·32 cites·11 claims
- 0376US5546319AMethod of and system for charged particle beam exposureFUJITSU LTD·Filed 1995·Granted Aug 13, 1996·21 cites·34 claims
- 0469US5721432AMethod of and system for charged particle beam exposureFUJITSU LTD·Filed 1996·Granted Feb 24, 1998·16 cites·5 claims
- 0569US5404018AMethod of and an apparatus for charged particle beam exposureFUJITSU LTD·Filed 1992·Granted Apr 4, 1995·22 cites·11 claims
- 0667US5382800ACharged particle beam exposure method and apparatusFUJITSU LTD·Filed 1993·Granted Jan 17, 1995·18 cites·20 claims
- 0765US5965895AMethod of providing changed particle beam exposure in which representative aligning marks on an object are detected to calculate an actual position to perform exposureFUJITSU LTD·Filed 1997·Granted Oct 12, 1999·13 cites·9 claims
- 0862US5338939ACharged particle beam exposure including a heat blocking partition positioned near deflecting coilsFUJITSU LTD·Filed 1993·Granted Aug 16, 1994·15 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →