Inventor · disambiguated record
Hironori Nishino
Also filed as: NISHINO HIRONORI
22 granted patents·2 pending applications·180 citations·filing 1992–2020
94Inventor score
Top patents by PatentIndex Score
24 records- 0187US7473922B2Infrared detectorFUJITSU LTD·Filed 2006·Granted Jan 6, 2009·32 cites·15 claims
- 0287US5431738AApparatus for growing group II-VI mixed compound semiconductorFUJITSU LTD·Filed 1994·Granted Jul 11, 1995·44 cites·5 claims
- 0379US11264417B2Photo detection element, optical sensor, and method of manufacturing photo detection elementFUJITSU LTD·Filed 2019·Granted Mar 1, 2022·2 cites·18 claims
- 0479US6218212B1Apparatus for growing mixed compound semiconductor and growth method using the sameFUJITSU LTD·Filed 1994·Granted Apr 17, 2001·31 cites·25 claims
- 0574US10236319B2Photodetector and imaging deviceFUJITSU LTD·Filed 2017·Granted Mar 19, 2019·2 cites·13 claims
- 0673US8120687B2Signal reading method, signal reading circuit, and image sensorNISHINO HIRONORI·Filed 2009·Granted Feb 21, 2012·5 cites·17 claims
- 0772US8373155B2Infrared photodetectorTECHNICAL RES & DEV INST MINISTRY OF DEFENSE OF JAPAN·Filed 2009·Granted Feb 12, 2013·5 cites·10 claims
- 0870US10404929B2Signal output circuit, image sensor, and imaging apparatusFUJITSU LTD·Filed 2017·Granted Sep 3, 2019·1 cites·15 claims
- 0968US10145741B2Heat source detection device and heat source detection methodFUJITSU LTD·Filed 2017·Granted Dec 4, 2018·1 cites·8 claims
- 1062US9747138B2Information processing device and methodFUJITSU LTD·Filed 2015·Granted Aug 29, 2017·1 cites·9 claims
- 1161US5324386AMethod of growing group II-IV mixed compound semiconductor and an apparatus used thereforFUJITSU LTD·Filed 1992·Granted Jun 28, 1994·12 cites·8 claims
- 1259US11329183B2Photo detection element, optical sensor, and method of manufacturing photo detection elementFUJITSU LTD·Filed 2019·Granted May 10, 2022·0 cites·17 claims
- 1358US8076740B2Photo detector with a quantum dot layerUCHIYAMA YASUHITO·Filed 2006·Granted Dec 13, 2011·1 cites·10 claims
- 1458US6437414B1Optical semiconductor device and method for fabricating the sameFUJITSU LTD·Filed 2000·Granted Aug 20, 2002·7 cites·13 claims
- 1557US8395106B2Optical semiconductor device with quantum dots having configurational anisotropyDOSHIDA MINORU·Filed 2009·Granted Mar 12, 2013·3 cites·16 claims
- 1656US5952703ASemiconductor devices and manufacturing method using II-VI compounds with wide areaFUJITSU LTD·Filed 1995·Granted Sep 14, 1999·21 cites·14 claims
- 1754US2013146844A1Light detector and method for producing light detectorTECHNICAL RES & DEV INST MINIS·Filed 2012·Application pending·0 cites
- 1851US10418500B2Infrared detector, imaging device, and imaging systemFUJITSU LTD·Filed 2018·Granted Sep 17, 2019·0 cites·15 claims
- 1950US2010032651A1Quantum dot infrared photodetectorTECH RES DEV INST MINI DEFENCE·Filed 2009·Application pending·0 cites
- 2049US11070748B2Infrared detector, infrared imaging apparatus using the same, and controlling method of infrared detectorFUJITSU LTD·Filed 2019·Granted Jul 20, 2021·0 cites·6 claims
- 2145US11193832B2Infrared detector, imaging device including the same, and manufacturing method for infrared detectorFUJITSU LTD·Filed 2020·Granted Dec 7, 2021·0 cites·7 claims
- 2245US8426816B2Imaging device, A/D converter device and reading circuitSAWADA AKIRA·Filed 2010·Granted Apr 23, 2013·1 cites·20 claims
- 2345US6504222B1Multi-quantum well infrared photo-detectorFUJITSU LTD·Filed 1999·Granted Jan 7, 2003·11 cites·15 claims
- 2439US10616517B2Imaging apparatusFUJITSU LTD·Filed 2017·Granted Apr 7, 2020·0 cites·3 claims
Join the waitlist — get patent alerts
Get an alert when Hironori Nishino files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →