Inventor · disambiguated record
Hiroshi Oba
Also filed as: MURAYAMA TETSUO · OBA HIROSHI
29 granted patents·3 pending applications·126 citations·filing 1975–2021
95Inventor score
Files withHITACHI HIGH TECH SCIENCE CORP18NIPPON STEEL CORP7HITACHI HIGH TECH CORP2MITSUBISHI CHEM IND2ASMO CO LTD1
Top patents by PatentIndex Score
32 records- 0186US9111717B2Ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 18, 2015·7 cites·6 claims
- 0285US8460842B2Defect repair apparatus and method for EUV mask using a hydrogen ion beamOGAWA TAKASHI·Filed 2011·Granted Jun 11, 2013·7 cites·23 claims
- 0380US9773634B2Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2017·Granted Sep 26, 2017·2 cites·11 claims
- 0478US4184871APhotosensitive composition for electrophotographyMITSUBISHI CHEM IND·Filed 1978·Granted Jan 22, 1980·17 cites·9 claims
- 0576US8822911B2Focused ion beam apparatus and method of adjusting ion beam opticsHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Sep 2, 2014·3 cites·5 claims
- 0676US5248353AMethod of producing steel wires each having very small diameter, high strength and excellent ductilityNIPPON STEEL CORP·Filed 1990·Granted Sep 28, 1993·21 cites·9 claims
- 0775US9129771B2Emitter structure, gas ion source and focused ion beam systemHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Sep 8, 2015·2 cites·19 claims
- 0874US9378858B2Repair apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Jun 28, 2016·2 cites·5 claims
- 0971US10056232B2Charged particle beam apparatus and plasma ignition methodHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Aug 21, 2018·1 cites·6 claims
- 1071US9418817B2Focused ion beam apparatus and control method thereofHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Aug 16, 2016·2 cites·17 claims
- 1169US10658143B2Method of manufacturing emitterHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted May 19, 2020·1 cites·11 claims
- 1266US4042391AProcess for forming vesicular photographic images by employing simultaneous actinic light and infra-red reflex exposureMITSUBISHI CHEM IND·Filed 1975·Granted Aug 16, 1977·8 cites·9 claims
- 1359US9583299B2Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2014·Granted Feb 28, 2017·0 cites·1 claims
- 1455US9640361B2Emitter structure, gas ion source and focused ion beam systemHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted May 2, 2017·0 cites·8 claims
- 1554US11017982B2Composite charged particle beam apparatus and control method thereofHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted May 25, 2021·0 cites·5 claims
- 1652US9793085B2Focused ion beam apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Oct 17, 2017·0 cites·11 claims
- 1752US2016322123A1Repair ApparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Application pending·0 cites
- 1850US11721517B2Focused ion beam processing apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Aug 8, 2023·0 cites·8 claims
- 1949US2024355574A1Focused ion beam deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 2049US2025285827A1Charged particle beam deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Application pending·0 cites
- 2148US9773637B2Plasma ion source and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 26, 2017·0 cites·7 claims
- 2248US5280212ABrush assembly for use with a direct current machineOBA HIROSHI·Filed 1993·Granted Jan 18, 1994·17 cites·9 claims
- 2347US10176964B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Jan 8, 2019·0 cites·19 claims
- 2446US5662747ABainite wire rod and wire for drawing and methods of producing the sameNIPPON STEEL CORP·Filed 1994·Granted Sep 2, 1997·6 cites·8 claims
- 2546US5243245AStructure and method of fixing housingASMO CO LTD·Filed 1992·Granted Sep 7, 1993·14 cites·22 claims
- 2644US11017988B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted May 25, 2021·0 cites·8 claims
- 2744US9773646B2Plasma ion source and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 26, 2017·0 cites·7 claims
- 2836US5658402AHigh-carbon steel wire rod and wire excellent in drawability and methods of producing the sameNIPPON STEEL CORP·Filed 1994·Granted Aug 19, 1997·4 cites·10 claims
- 2936US5647918ABainite wire rod and wire for drawing and methods of producing the sameNIPPON STEEL CORP·Filed 1994·Granted Jul 15, 1997·4 cites·7 claims
- 3035US5665182AHigh-carbon steel wire rod and wire excellent in drawability and methods of producing the sameNIPPON STEEL CORP·Filed 1994·Granted Sep 9, 1997·3 cites·10 claims
- 3135US5650027AHigh-carbon steel wire rod and wire excellent in drawability and methods of producing the sameNIPPON STEEL CORP·Filed 1994·Granted Jul 22, 1997·3 cites·10 claims
- 3230US5658399ABainite wire rod and wire for drawing and methods of producing the sameNIPPON STEEL CORP·Filed 1994·Granted Aug 19, 1997·2 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →