Inventor · disambiguated record
Hiroyuki Ohta
Also filed as: OHTA HIROYUKI
146 granted patents·30 pending applications·2,473 citations·filing 1977–2023
99Inventor score
Files withHITACHI LTD51FUJITSU LTD21RENESAS TECH CORP14SAKAI DISPLAY PRODUCTS CORP12FUJITSU MICROELECTRONICS LTD10
Top patents by PatentIndex Score
176 records- 0196US7293466B2Bolt with function of measuring strainHITACHI LTD·Filed 2005·Granted Nov 13, 2007·43 cites·15 claims
- 0296US6468845B1Semiconductor apparatus having conductive thin films and manufacturing apparatus thereforHITACHI LTD·Filed 2000·Granted Oct 22, 2002·80 cites·35 claims
- 0395US7119428B2Semiconductor deviceELPIDA MEMORY INC·Filed 2004·Granted Oct 10, 2006·109 cites·8 claims
- 0495US6982465B2Semiconductor device with CMOS-field-effect transistors having improved drain current characteristicsRENESAS TECH CORP·Filed 2001·Granted Jan 3, 2006·121 cites·16 claims
- 0595US5377405AMethod for mounting components and an apparatus thereforYAMAHA MOTOR CO LTD·Filed 1993·Granted Jan 3, 1995·103 cites·56 claims
- 0694US8695433B2Mechanical-quantity measuring deviceHITACHI LTD·Filed 2013·Granted Apr 15, 2014·17 cites·12 claims
- 0794US7875521B2Semiconductor device and production method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Jan 25, 2011·23 cites·6 claims
- 0893US8056421B2Apparatus for measuring a mechanical quantitySUMIGAWA TAKASHI·Filed 2010·Granted Nov 15, 2011·25 cites·3 claims
- 0993US7707894B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2008·Granted May 4, 2010·23 cites·2 claims
- 1093US7378305B2Semiconductor integrated circuit and fabrication process thereofFUJITSU LTD·Filed 2005·Granted May 27, 2008·27 cites·9 claims
- 1193US7196396B2Semiconductor device having STI without divot and its manufactureFUJITSU LTD·Filed 2005·Granted Mar 27, 2007·22 cites·5 claims
- 1293US6268034B1Optical information recording medium and method for producing the same, method for recording and reproducing information thereon and recording/reproducing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Jul 31, 2001·84 cites·73 claims
- 1393US5444302ASemiconductor device including multi-layer conductive thin film of polycrystalline materialHITACHI LTD·Filed 1993·Granted Aug 22, 1995·61 cites·32 claims
- 1491US7992448B2Mechanical-quantity measuring deviceHITACHI LTD·Filed 2007·Granted Aug 9, 2011·22 cites·2 claims
- 1591US7579617B2Semiconductor device and production method thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Aug 25, 2009·18 cites·11 claims
- 1690US7252010B2Pressure sensor system with semiconductor chip and antenna memberHITACHI LTD·Filed 2005·Granted Aug 7, 2007·21 cites·9 claims
- 1789US6412187B1Analog quantity display method, analog quantity measuring method, and digital/analog display type measuring instrumentMITUTOYO CORP·Filed 2000·Granted Jul 2, 2002·43 cites·17 claims
- 1889US5909052ASemiconductor device having plural chips with the sides of the chips in face-to-face contact with each other in the same crystal planeHITACHI LTD·Filed 1995·Granted Jun 1, 1999·101 cites·32 claims
- 1988USD721349SCommunication apparatusMITUTOYO CORP·Filed 2014·Granted Jan 20, 2015·43 cites·1 claims
- 2088US6686274B1Semiconductor device having cobalt silicide film in which diffusion of cobalt atoms is inhibited and its production processRENESAS TECH CORP·Filed 1999·Granted Feb 3, 2004·63 cites·13 claims
- 2187US7683362B2Semiconductor device and production method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 23, 2010·13 cites·19 claims
- 2287US7208812B2Semiconductor device having STI without divot and its manufactureFUJITSU LTD·Filed 2003·Granted Apr 24, 2007·36 cites·7 claims
- 2386US7626215B2Semiconductor device and method of manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·9 cites·12 claims
- 2485US8365609B2Mechanical-quantity measuring deviceHITACHI LTD·Filed 2011·Granted Feb 5, 2013·7 cites·8 claims
- 2585US7592214B2Method of manufacturing a semiconductor device including epitaxially growing semiconductor epitaxial layers on a surface of semiconductor substrateFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Sep 22, 2009·10 cites·9 claims
- 2685US7430920B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2005·Granted Oct 7, 2008·13 cites·2 claims
- 2785US6933031B2Optical information recording medium and its manufacturing methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 23, 2005·18 cites·13 claims
- 2885US5491888AMethod for mounting component chips and an apparatus thereforYAMAHA MOTOR CO LTD·Filed 1994·Granted Feb 20, 1996·53 cites·22 claims
- 2984US7770462B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2008·Granted Aug 10, 2010·11 cites·8 claims
- 3083US8258576B2Method of manufacturing a semiconductor device including epitaxially growing semiconductor epitaxial layers on a surface of semiconductor substrateOHTA HIROYUKI·Filed 2009·Granted Sep 4, 2012·9 cites·7 claims
- 3183US7968414B2Semiconductor device and production method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2010·Granted Jun 28, 2011·6 cites·9 claims
- 3283US7484422B2Mechanical-quantity measuring deviceHITACHI LTD·Filed 2006·Granted Feb 3, 2009·14 cites·9 claims
- 3382US5384956AMethod for mounting componentsYAMAHA MOTOR CO LTD·Filed 1993·Granted Jan 31, 1995·74 cites·22 claims
- 3481US7601996B2Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Oct 13, 2009·6 cites·5 claims
- 3581US7109568B2Semiconductor device including n-channel fets and p-channel fets with improved drain current characteristicsHITACHI LTD·Filed 2003·Granted Sep 19, 2006·30 cites·7 claims
- 3681US6821707B2Optical information recording medium, producing method thereof and method of recording/erasing/reproducing informationMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Nov 23, 2004·27 cites·42 claims
- 3781US5962535AComposition for alzheimer's diseaseTAKEDA CHEMICAL INDUSTRIES LTD·Filed 1998·Granted Oct 5, 1999·53 cites·5 claims
- 3880US6960832B2Semiconductor device and its production processRENESAS TECH CORP·Filed 2004·Granted Nov 1, 2005·22 cites·9 claims
- 3979US12224356B2Thin film transistor and manufacturing method of same, and display deviceSAKAI DISPLAY PRODUCTS CORP·Filed 2019·Granted Feb 11, 2025·2 cites·16 claims
- 4079US7459786B2Semiconductor deviceRENESAS TECH CORP·Filed 2005·Granted Dec 2, 2008·9 cites·10 claims
- 4179US7442593B2Method of manufacturing semiconductor device having conductive thin filmsRENESAS TECH CORP·Filed 2006·Granted Oct 28, 2008·4 cites·9 claims
- 4279US6268295B1Method of manufacturing semiconductor deviceFUJITSU LTD·Filed 1998·Granted Jul 31, 2001·62 cites·13 claims
- 4379US6017784AManufacture method of semiconductor device with suppressed impurity diffusion from gate electrodeFUJITSU LTD·Filed 1997·Granted Jan 25, 2000·53 cites·29 claims
- 4478US9709377B2Strain sensor chip mounting structure, strain sensor chip and method of manufacturing a strain sensor chip mounting structureOHTA HIROYUKI·Filed 2012·Granted Jul 18, 2017·4 cites·19 claims
- 4578US7906848B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Mar 15, 2011·8 cites·16 claims
- 4678US7793551B2Load sensor with shock relaxation material to protect semiconductor strain sensorHITACHI CONSTRUCTION MACHINERY·Filed 2008·Granted Sep 14, 2010·10 cites·18 claims
- 4778US7759215B2Semiconductor device having STI without divot and its manufactureFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Jul 20, 2010·6 cites·15 claims
- 4878US7585739B2Semiconductor device and method of fabricating the sameFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Sep 8, 2009·6 cites·8 claims
- 4977US5229643ASemiconductor apparatus and semiconductor packageHITACHI LTD·Filed 1991·Granted Jul 20, 1993·54 cites·26 claims
- 5077US4510543AMagnetic head system for tape playerPIONEER ELECTRONIC CORP·Filed 1981·Granted Apr 9, 1985·19 cites·6 claims
Showing the top 50 of 176 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →