Inventor · disambiguated record
Hideaki Onozuka
Also filed as: ONOZUKA HIDEAKI
5 granted patents·7 pending applications·45 citations·filing 2002–2022
77Inventor score
Top patents by PatentIndex Score
12 records- 0186US7661912B2Tool having damperHITACHI TOOL ENG·Filed 2006·Granted Feb 16, 2010·29 cites·9 claims
- 0269US7500812B2Method and program for calculating maximum depth of cut without self-excited vibration of cutting toolHITACHI LTD·Filed 2007·Granted Mar 10, 2009·7 cites·6 claims
- 0353US7810417B2Method for estimating self-vibration of milling tool in the operating processHITACHI LTD·Filed 2006·Granted Oct 12, 2010·4 cites·6 claims
- 0447US6753494B2Sintered body and electrode, method for surface densitication of these, process for manufacturing electrode by this method and circuit breakerHITACHI LTD·Filed 2002·Granted Jun 22, 2004·5 cites·16 claims
- 0547US2025022116A1Mask image generation method, inspection method, and inspection apparatusHITACHI ASTEMO LTD·Filed 2022·Application pending·0 cites
- 0647US2024362771A1Visual inspection device, visual inspection method, image generation device, and image generation methodHITACHI ASTEMO LTD·Filed 2022·Application pending·0 cites
- 0744US2024153066A1Visual inspection apparatus, visual inspection method, image generation apparatus, and image generation methodHITACHI ASTEMO LTD·Filed 2022·Application pending·0 cites
- 0842US2025347629A1Inspection device, inspection method, and method of manufacturing pistonHITACHI ASTEMO LTD·Filed 2021·Application pending·0 cites
- 0940US2010129169A1Corner Portion Working ToolHITACHI LTD·Filed 2009·Application pending·0 cites
- 1039US2014123740A1Working Abnormality Detecting Device and Working Abnormality Detecting Method for Machine ToolYOSHIKAWA TAKEHISA·Filed 2012·Application pending·0 cites
- 1136US2014288882A1Processing Abnormality Detection Method and Processing DeviceNAKASU NOBUAKI·Filed 2012·Application pending·0 cites
- 1232US8967927B2Machine toolONOZUKA HIDEAKI·Filed 2010·Granted Mar 3, 2015·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →