Inventor · disambiguated record
Hiroshi Otani
Also filed as: OTANI HIROSHI
30 granted patents·3 pending applications·960 citations·filing 1973–2022
97Inventor score
Top patents by PatentIndex Score
33 records- 0197US6316840B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 13, 2001·168 cites·20 claims
- 0295US7265371B2Radiation image conversion panelKONICA MINOLTA MED & GRAPHIC·Filed 2005·Granted Sep 4, 2007·32 cites·21 claims
- 0392US6508125B2Electrostatic capacitance type acceleration sensor, electrostatic capacitance type angular acceleration sensor and electrostatic actuatorMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 21, 2003·45 cites·18 claims
- 0491US5956449AStructure for mounting an optical circuitNEC CORP·Filed 1997·Granted Sep 21, 1999·174 cites·7 claims
- 0585US7579608B2Particle-beam treatment systemMITSUBISHI ELECTRIC CORP·Filed 2007·Granted Aug 25, 2009·23 cites·9 claims
- 0683US5783748ASemiconductor sensor including protective resin packageMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 21, 1998·62 cites·16 claims
- 0780US6763716B2Semiconductor acceleration sensorMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jul 20, 2004·29 cites·13 claims
- 0880US5333505ASemiconductor pressure sensor for use at high temperature and pressure and method of manufacturing sameMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Aug 2, 1994·64 cites·19 claims
- 0976US5864062ASemiconductor acceleration sensorMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jan 26, 1999·50 cites·7 claims
- 1073US5859590AAbnormality detection apparatus and abnormality detection methodMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jan 12, 1999·37 cites·14 claims
- 1172US6377491B2Non-volatile memory for storing erase operation informationFUJITSU LTD·Filed 2001·Granted Apr 23, 2002·20 cites·2 claims
- 1270US6049120AThermal-stress-resistant semiconductor sensorMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Apr 11, 2000·38 cites·12 claims
- 1368US5864063AElectrostatic capacity-type acceleration sensorMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jan 26, 1999·36 cites·16 claims
- 1463US5783750ASemiconductor sensor including laminated supporting pedestalMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 21, 1998·24 cites·3 claims
- 1561US8299447B2Rotating irradiation apparatusHAGINO TAKESHI·Filed 2008·Granted Oct 30, 2012·4 cites·6 claims
- 1661US5460653ASpray type flux applying deviceNEC CORP·Filed 1993·Granted Oct 24, 1995·28 cites·19 claims
- 1759US6963134B2Semiconductor sensor with substrate having a certain electric potentialMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Nov 8, 2005·8 cites·14 claims
- 1858US11221806B2Print support apparatus, method of operating print support apparatus, and operation programFUJIFILM CORP·Filed 2021·Granted Jan 11, 2022·0 cites·13 claims
- 1958US8698847B2Image display apparatus, method, program, and recording mediumOTANI HIROSHI·Filed 2010·Granted Apr 15, 2014·2 cites·13 claims
- 2057US8550711B2Treatment table systemMAEDA HIRONORI·Filed 2008·Granted Oct 8, 2013·1 cites·3 claims
- 2157US5903159AMicrowave sensor for sensing discharge faultsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 11, 1999·20 cites·4 claims
- 2257US5656776ASemiconductor sensor with sealed packageMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Aug 12, 1997·23 cites·6 claims
- 2356US6093576ASemiconductor sensor and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jul 25, 2000·21 cites·11 claims
- 2455US5974880ACapacitance acceleration sensorMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Nov 2, 1999·16 cites·1 claims
- 2555US5726576AMicrowave sensor for detecting a discharge occurring in an electrical apparatusMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 10, 1998·18 cites·5 claims
- 2651US11641431B2Image processing apparatus, image processing method, program, and recording mediumFUJIFILM CORP·Filed 2022·Granted May 2, 2023·0 cites·20 claims
- 2751US2005253208A1Semiconductor micro deviceMITSUBISHI ELECTRIC CORP·Filed 2005·Application pending·0 cites
- 2846US6924537B2Semiconductor device including a potential drawing portion formed at a cornerMITSUBISHI ELECTRIC CORP·Filed 2004·Granted Aug 2, 2005·2 cites·9 claims
- 2939US3939325AThermal record printer head and method of making the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1973·Granted Feb 17, 1976·4 cites·7 claims
- 3038US2005040340A1Radiographic image conversion panelFiled 2003·Application pending·0 cites
- 3138US2004183029A1Radiographic image conversion panelFiled 2003·Application pending·0 cites
- 3237US5980762AMethod of micromachining a semiconductorMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Nov 9, 1999·6 cites·4 claims
- 3333US5374848AThermal stress resistant semiconductor device mounting arrangementMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Dec 20, 1994·5 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →