Inventor · disambiguated record
Hideaki Sasazawa
Also filed as: HARUKAZU MIYAMOTO · MIYAMOTO HARUKAZU · SASAZAWA HIDEAKI
23 granted patents·4 pending applications·221 citations·filing 1995–2015
95Inventor score
Top patents by PatentIndex Score
27 records- 0194US7449689B2Dimension measuring SEM system, method of evaluating shape of circuit pattern and a system for carrying out the methodHITACHI HIGH TECH CORP·Filed 2005·Granted Nov 11, 2008·23 cites·20 claims
- 0293US7969567B2Method and device for detecting shape of surface of mediumHITACHI HIGH TECH CORP·Filed 2009·Granted Jun 28, 2011·18 cites·13 claims
- 0393US7273685B2Method for controlling semiconductor device production process and a method for producing semiconductor devicesRENESAS TECH CORP·Filed 2005·Granted Sep 25, 2007·17 cites·14 claims
- 0490US8547545B2Method and apparatus for inspecting a surface of a substrateSASAZAWA HIDEAKI·Filed 2011·Granted Oct 1, 2013·25 cites·12 claims
- 0590US7816062B2Method and apparatus for semiconductor device production process monitoring and method and apparatus for estimating cross sectional shape of a patternHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 19, 2010·17 cites·27 claims
- 0685US8359661B2Magnetic device inspection apparatus and magnetic device inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 22, 2013·10 cites·18 claims
- 0785US5780866AMethod and apparatus for automatic focusing and a method and apparatus for three dimensional profile detectionHITACHI LTD·Filed 1995·Granted Jul 14, 1998·62 cites·26 claims
- 0876US7898652B2Method and apparatus for detecting defects on a disk surfaceHITACHI HIGH TECH CORP·Filed 2009·Granted Mar 1, 2011·4 cites·20 claims
- 0969US8411928B2Scatterometry method and device for inspecting patterned mediumSASAZAWA HIDEAKI·Filed 2009·Granted Apr 2, 2013·2 cites·11 claims
- 1069US8040772B2Method and apparatus for inspecting a pattern shapeHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 18, 2011·1 cites·17 claims
- 1167US8253935B2Disk surface inspection apparatus, inspection system thereof, and inspection method thereofHARIYAMA TATSUO·Filed 2010·Granted Aug 28, 2012·2 cites·15 claims
- 1266US8638430B2Method for defect determination in fine concave-convex pattern and method for defect determination on patterned mediumSASAZAWA HIDEAKI·Filed 2010·Granted Jan 28, 2014·2 cites·12 claims
- 1365US7084990B2Method and its apparatus for measuring size and shape of fine patternsHITACHI LTD·Filed 2003·Granted Aug 1, 2006·13 cites·12 claims
- 1460US7092348B2Optical recording apparatus capable of changing the length of synchronization portionsHITACHI LTD·Filed 2005·Granted Aug 15, 2006·0 cites·6 claims
- 1557US8260029B2Pattern shape inspection method and apparatus thereofSAITO KEIYA·Filed 2009·Granted Sep 4, 2012·4 cites·14 claims
- 1657US7075884B2Optical recording apparatus capable of changing the length of synchronization portionsHITACHI LTD·Filed 2005·Granted Jul 11, 2006·0 cites·3 claims
- 1756US6631547B2Manufacturing method for thin film magnetic headsHITACHI LTD·Filed 2001·Granted Oct 14, 2003·3 cites·5 claims
- 1854US8736830B2Pattern inspection device of substrate surface and pattern inspection method of the sameWATANABE MASAHIRO·Filed 2009·Granted May 27, 2014·0 cites·13 claims
- 1952US8279431B2Spectral detection method and device, and defect inspection method and apparatus using the sameHIROSE TAKENORI·Filed 2009·Granted Oct 2, 2012·1 cites·12 claims
- 2049US7336816B2Method and apparatus for measuring shape of bumpsHITACHI VIA MECHANICS LTD·Filed 2004·Granted Feb 26, 2008·6 cites·21 claims
- 2148US2008145517A1Method for manufacturing plasma display panel, and apparatus for inspecting plasma display panelSASAZAWA HIDEAKI·Filed 2007·Application pending·0 cites
- 2244US10352879B2X-ray inspection method and deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 16, 2019·0 cites·15 claims
- 2340US6831277B1Method for measuring dimensions and alignment of thin film magnetic head and apparatus thereforHITACHI LTD·Filed 1999·Granted Dec 14, 2004·5 cites·12 claims
- 2439US2013077092A1Substrate surface defect inspection method and inspection deviceSASAZAWA HIDEAKI·Filed 2012·Application pending·0 cites
- 2538US2018209924A1Defect Determining Method and X-Ray Inspection DeviceHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
- 2637US7355143B1Circuit board production method and its apparatusHITACHI LTD·Filed 1999·Granted Apr 8, 2008·6 cites·11 claims
- 2735US2012287426A1Pattern inspection method and device for sameSASAZAWA HIDEAKI·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Hideaki Sasazawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →