Inventor · disambiguated record
Hideki Shindo
Also filed as: SHINDO HIDEKI
9 granted patents·89 citations·filing 2001–2015
87Inventor score
Top patents by PatentIndex Score
9 records- 0189US8336223B2Roundness measuring apparatusNAKAYAMA TATSUKI·Filed 2010·Granted Dec 25, 2012·17 cites·11 claims
- 0288US7950164B2Surface texture measurement apparatus and roundness measuring apparatusMITUTOYO CORP·Filed 2010·Granted May 31, 2011·12 cites·7 claims
- 0382US6886264B2Reference fixture for roundness measuring instrumentMITUTOYO CORP·Filed 2004·Granted May 3, 2005·36 cites·8 claims
- 0469US8359908B2Surface texture measuring deviceMITUTOYO CORP·Filed 2010·Granted Jan 29, 2013·4 cites·5 claims
- 0565US9644950B2Shape measuring apparatus and point sensor positioning unitMITUTOYO CORP·Filed 2015·Granted May 9, 2017·1 cites·8 claims
- 0665US8020309B2Circularity measuring apparatusMITUTOYO CORP·Filed 2010·Granted Sep 20, 2011·2 cites·2 claims
- 0763US6526364B2Method and apparatus for measuring roundnessMITUTOYO CORP·Filed 2001·Granted Feb 25, 2003·14 cites·15 claims
- 0862US9441715B2Moving mechanism and form measuring apparatusMITUTOYO CORP·Filed 2014·Granted Sep 13, 2016·2 cites·6 claims
- 0959US9316476B2Profile measuring instrument, adjusting method for profile measuring instrument, and profile measuring methodMITUTOYO CORP·Filed 2013·Granted Apr 19, 2016·1 cites·3 claims
Join the waitlist — get patent alerts
Get an alert when Hideki Shindo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →