Inventor · disambiguated record
Hiroyasu Simizu
Also filed as: SIMIZU HIROYASU
12 granted patents·119 citations·filing 1995–2002
90Inventor score
Top patents by PatentIndex Score
12 records- 0185US5853043AMethod and apparatus for continuous casting of a thin slabSUMITOMO METAL IND·Filed 1995·Granted Dec 29, 1998·29 cites·7 claims
- 0284US5747819ACharged particle beam transfer device exhibiting low aberrationNIKON CORP·Filed 1996·Granted May 5, 1998·44 cites·20 claims
- 0371US6621090B2Electron-beam sources exhibiting reduced spherical aberration, and microlithography apparatus comprising sameNIKON CORP·Filed 2001·Granted Sep 16, 2003·9 cites·30 claims
- 0458US6008498ACharged particle beam apparatus and method of using the sameNIKON CORP·Filed 1997·Granted Dec 28, 1999·14 cites·21 claims
- 0555US6635881B2Charged-particle-beam projection-lens system exhibiting reduced blur and geometric distortion, and microlithography apparatus including sameNIKON CORP·Filed 2001·Granted Oct 21, 2003·4 cites·10 claims
- 0653US6545282B2Apparatus and methods for reducing Coulombic blur in charged-particle-beam microlithographyNIKON CORP·Filed 2002·Granted Apr 8, 2003·2 cites·7 claims
- 0747US6608313B2Methods and devices for achieving alignment of a beam-propagation axis with a center of an aperture in a charged-particle-beam optical systemNIKON CORP·Filed 2001·Granted Aug 19, 2003·2 cites·9 claims
- 0843US6066855ACharged-particle-beam optical system exhibiting aberration correctionNIKON CORP·Filed 1998·Granted May 23, 2000·6 cites·29 claims
- 0942US6906336B2Methods for reducing blur and variation in blur in projected images produced by charged-particle-beam microlithographyNIKON CORP·Filed 2002·Granted Jun 14, 2005·0 cites·26 claims
- 1040US6049084ACharged-particle-beam optical systemNIKON CORP·Filed 1998·Granted Apr 11, 2000·8 cites·6 claims
- 1130US6087668ACharged-particle-beam projection method and apparatusNIKON CORP·Filed 1997·Granted Jul 11, 2000·1 cites·10 claims
- 1229US6627899B2Magnetic lenses, charged-particle-beam optical systems, and charged-particle-beam pattern-transfer apparatusNIKON CORP·Filed 1999·Granted Sep 30, 2003·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →