Inventor · disambiguated record
Hiroyuki Sugamoto
Also filed as: SUGAMOTO HIROYUKI
17 granted patents·1 pending application·115 citations·filing 1990–2012
93Inventor score
Top patents by PatentIndex Score
18 records- 0180US9236097B2Semiconductor memory device and data reading methodSUGAMOTO HIROYUKI·Filed 2012·Granted Jan 12, 2016·10 cites·10 claims
- 0271US6400618B1Semiconductor memory device with efficient redundancy operationFUJITSU LTD·Filed 2000·Granted Jun 4, 2002·18 cites·10 claims
- 0369US6559669B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2001·Granted May 6, 2003·13 cites·3 claims
- 0468US6469551B2Starting circuit for integrated circuit deviceFUJITSU LTD·Filed 1999·Granted Oct 22, 2002·22 cites·12 claims
- 0561US6891393B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2003·Granted May 10, 2005·7 cites·5 claims
- 0657US6462997B2Circuit for resetting a pair of data buses of a semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted Oct 8, 2002·8 cites·11 claims
- 0756US7593275B2Semiconductor memory deviceFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Sep 22, 2009·3 cites·7 claims
- 0853US6314033B1Semiconductor memory device with redundancy circuitFUJITSU LTD·Filed 2001·Granted Nov 6, 2001·8 cites·11 claims
- 0952US6542421B2Semiconductor memory device with redundancy circuitFUJITSU LTD·Filed 2001·Granted Apr 1, 2003·7 cites·15 claims
- 1045US6741518B2Semiconductor integrated circuit device and data writing method thereforFUJITSU LTD·Filed 2001·Granted May 25, 2004·4 cites·20 claims
- 1145US2010052727A1Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2009·Application pending·0 cites
- 1244US7663392B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Feb 16, 2010·0 cites·2 claims
- 1339US6545940B2Semiconductor integrated circuit having enhanced acquisition of external signalFUJITSU LTD·Filed 2001·Granted Apr 8, 2003·2 cites·20 claims
- 1436US7378863B2Synchronous semiconductor device, and inspection system and method for the sameFUJITSU LTD·Filed 2004·Granted May 27, 2008·0 cites·2 claims
- 1532US6525975B2Semiconductor integrated circuit device and data-write method thereofFUJITSU LTD·Filed 2001·Granted Feb 25, 2003·0 cites·14 claims
- 1632US6198680B1Circuit for resetting a pair of data buses of a semiconductor memory deviceFUJITSU LTD·Filed 1999·Granted Mar 6, 2001·2 cites·12 claims
- 1732US5349219AWafer-scale semiconductor integrated circuit device and method of forming interconnection lines arranged between chips of wafer-scale semiconductor integrated circuit deviceFUJITSU LTD·Filed 1993·Granted Sep 20, 1994·5 cites·16 claims
- 1830US5032889AWiring structure in a wafer-scale integrated circuitFUJITSU LTD·Filed 1990·Granted Jul 16, 1991·6 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →