Inventor · disambiguated record
Hisanari Takahashi
Also filed as: TAKAHASHI HISANARI
7 granted patents·8 pending applications·3 citations·filing 2017–2025
71Inventor score
Files withHAMAMATSU PHOTONICS KK15
Top patents by PatentIndex Score
15 records- 0185US11913836B2Dispersion measurement apparatus and dispersion measurement methodHAMAMATSU PHOTONICS KK·Filed 2021·Granted Feb 27, 2024·1 cites·14 claims
- 0283US10082720B2Wavelength conversion element and wavelength conversion light pulse waveform shaping deviceHAMAMATSU PHOTONICS KK·Filed 2017·Granted Sep 25, 2018·2 cites·14 claims
- 0378US12366480B2Dispersion measurement apparatus and dispersion measurement methodHAMAMATSU PHOTONICS KK·Filed 2023·Granted Jul 22, 2025·0 cites·14 claims
- 0468US2025079805A1Terahertz wave detection device and terahertz wave detection methodHAMAMATSU PHOTONICS KK·Filed 2024·Application pending·0 cites
- 0565US12372458B2Optical property measurement apparatus and optical property measurement methodHAMAMATSU PHOTONICS KK·Filed 2023·Granted Jul 29, 2025·0 cites·19 claims
- 0664US12392720B2Time response measurement apparatus and time response measurement methodHAMAMATSU PHOTONICS KK·Filed 2023·Granted Aug 19, 2025·0 cites·14 claims
- 0761US12259601B2Light shaping device and light shaping methodHAMAMATSU PHOTONICS KK·Filed 2021·Granted Mar 25, 2025·0 cites·24 claims
- 0861US2023361536A1Laser moduleHAMAMATSU PHOTONICS KK·Filed 2023·Application pending·0 cites
- 0957US12504348B2Dispersion measurement device and dispersion measurement methodHAMAMATSU PHOTONICS KK·Filed 2022·Granted Dec 23, 2025·0 cites·11 claims
- 1057US2025347510A1Interferometric measurement apparatusHAMAMATSU PHOTONICS KK·Filed 2025·Application pending·0 cites
- 1154US2024201046A1Dispersion measuring device, and dispersion measuring methodHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
- 1253US2023333007A1Dispersion measurement device and dispersion measurement methodHAMAMATSU PHOTONICS KK·Filed 2021·Application pending·0 cites
- 1352US2025264407A1Interferometric measurement apparatusHAMAMATSU PHOTONICS KK·Filed 2025·Application pending·0 cites
- 1450US2024210275A1Dispersion measurement device and dispersion measurement methodHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
- 1550US2022236416A1Optical measurement device and optical measurement methodHAMAMATSU PHOTONICS KK·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →