Inventor · disambiguated record
Hirokazu Tamaki
Also filed as: TAMAKI HIROKAZU
11 granted patents·5 pending applications·11 citations·filing 2005–2022
82Inventor score
Top patents by PatentIndex Score
16 records- 0175US11380514B2Charged particle beam systemHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 5, 2022·2 cites·20 claims
- 0267US7263574B2Employment method of virtual tape volumeHITACHI LTD·Filed 2005·Granted Aug 28, 2007·5 cites·6 claims
- 0362US7650456B2Employment method of virtual tape volumeHITACHI LTD·Filed 2007·Granted Jan 19, 2010·3 cites·5 claims
- 0458US10636621B2Charged particle beam device for moving an aperture having plurality of openings and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 28, 2020·1 cites·4 claims
- 0552US2025292993A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0651US2025316441A1Charged particle beam device and method for controlling charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0749US9715991B2Charged particle beam device and spherical aberration correction methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jul 25, 2017·0 cites·12 claims
- 0849US2024420915A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0945US11791131B2Charged particle beam apparatus and method for controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·0 cites·7 claims
- 1045US11742172B2Charged particle beam device and control method thereofHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 29, 2023·0 cites·15 claims
- 1144US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
- 1243US11756764B2Charged particle beam apparatus and method of controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·14 claims
- 1343US10535497B2Electron microscope and imaging methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 14, 2020·0 cites·14 claims
- 1441US9208990B2Phase plate and electron microscopeTAMAKI HIROKAZU·Filed 2012·Granted Dec 8, 2015·0 cites·19 claims
- 1541US2024186108A1Charged Particle Beam SystemHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 1639US2024006148A1Aberration corrector and electron microscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →