Inventor · disambiguated record
Hifumi Tamura
Also filed as: ISHITANI TOHRU · TAMURA HIFUMI
31 granted patents·566 citations·filing 1974–1992
97Inventor score
Files withHITACHI LTD31
Top patents by PatentIndex Score
31 records- 0193US4774414ALiquid metal ion sourceHITACHI LTD·Filed 1986·Granted Sep 27, 1988·56 cites·2 claims
- 0291US4697086AApparatus for implanting ion microbeamHITACHI LTD·Filed 1984·Granted Sep 29, 1987·35 cites·2 claims
- 0389US4755685AIon micro beam apparatusHITACHI LTD·Filed 1986·Granted Jul 5, 1988·41 cites·7 claims
- 0487US4687938AIon sourceHITACHI LTD·Filed 1985·Granted Aug 18, 1987·38 cites·7 claims
- 0586US5008537AComposite apparatus with secondary ion mass spectrometry instrument and scanning electron microscopeHITACHI LTD·Filed 1989·Granted Apr 16, 1991·43 cites·16 claims
- 0685US4740698AHybrid charged particle apparatusHITACHI LTD·Filed 1987·Granted Apr 26, 1988·32 cites·6 claims
- 0783US4710632AIon microbeam apparatusHITACHI LTD·Filed 1985·Granted Dec 1, 1987·28 cites·8 claims
- 0880US4835399ACharged particle beam apparatusHITACHI LTD·Filed 1987·Granted May 30, 1989·24 cites·7 claims
- 0980US4631448AIon sourceHITACHI LTD·Filed 1984·Granted Dec 23, 1986·25 cites·20 claims
- 1079US4992661AMethod and apparatus for neutralizing an accumulated charge on a specimen by means of a conductive lattice deposited on the specimenHITACHI LTD·Filed 1988·Granted Feb 12, 1991·32 cites·31 claims
- 1177US4680507ALiquid metal ion sourceHITACHI LTD·Filed 1984·Granted Jul 14, 1987·21 cites·7 claims
- 1276US4774433AApparatus for generating metal ionsHITACHI LTD·Filed 1987·Granted Sep 27, 1988·22 cites·2 claims
- 1371US3986025AIon microanalyzerHITACHI LTD·Filed 1974·Granted Oct 12, 1976·14 cites·18 claims
- 1470US4841143ACharged particle beam apparatusHITACHI LTD·Filed 1988·Granted Jun 20, 1989·15 cites·8 claims
- 1567US4438371ASource of charged particles beamHITACHI LTD·Filed 1982·Granted Mar 20, 1984·12 cites·12 claims
- 1667US4233509AIon-electron analyzerHITACHI LTD·Filed 1979·Granted Nov 11, 1980·10 cites·12 claims
- 1766US4479060AApparatus for irradiation with charged particle beamsHITACHI LTD·Filed 1982·Granted Oct 23, 1984·11 cites·2 claims
- 1864US4510387AIon micro-analysisHITACHI LTD·Filed 1982·Granted Apr 9, 1985·11 cites·20 claims
- 1963US4567398ALiquid metal ion sourceHITACHI LTD·Filed 1983·Granted Jan 28, 1986·10 cites·2 claims
- 2061US5278407ASecondary-ion mass spectrometry apparatus using field limiting methodHITACHI LTD·Filed 1992·Granted Jan 11, 1994·29 cites·10 claims
- 2160US4733134ALiquid metal ion source with pulse generator controlHITACHI LTD·Filed 1986·Granted Mar 22, 1988·10 cites·5 claims
- 2255US4081674AIon microprobe analyzerHITACHI LTD·Filed 1976·Granted Mar 28, 1978·8 cites·20 claims
- 2354US4163153AIon beam meansHITACHI LTD·Filed 1977·Granted Jul 31, 1979·6 cites·7 claims
- 2450US4551650AField-emission ion source with spiral shaped filament heaterHITACHI LTD·Filed 1982·Granted Nov 5, 1985·7 cites·7 claims
- 2549US4687930AIon beam apparatusHITACHI LTD·Filed 1985·Granted Aug 18, 1987·7 cites·6 claims
- 2649US4624833ALiquid metal ion source and apparatusHITACHI LTD·Filed 1984·Granted Nov 25, 1986·5 cites·16 claims
- 2744US5086227ASecondary ion mass analyzing apparatusHITACHI LTD·Filed 1990·Granted Feb 4, 1992·7 cites·9 claims
- 2839US4560907AIon sourceHITACHI LTD·Filed 1983·Granted Dec 24, 1985·3 cites·14 claims
- 2936US4900974AIon sourceHITACHI LTD·Filed 1984·Granted Feb 13, 1990·2 cites·6 claims
- 3031US4924101ACharged particle sourceHITACHI LTD·Filed 1988·Granted May 8, 1990·1 cites·8 claims
- 3130US4833331AMethod of holding an electrically insulating sampleHITACHI LTD·Filed 1987·Granted May 23, 1989·1 cites·13 claims
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