Inventor · disambiguated record
Hiroyoshi Tanimoto
Also filed as: TANIMOTO HIROYOSHI
17 granted patents·4 pending applications·349 citations·filing 1995–2016
94Inventor score
Top patents by PatentIndex Score
21 records- 0194US5905279ALow resistant trench fill for a semiconductor deviceTOSHIBA KK·Filed 1996·Granted May 18, 1999·113 cites·28 claims
- 0293US9136468B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Sep 15, 2015·10 cites·20 claims
- 0392US9030881B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted May 12, 2015·15 cites·19 claims
- 0490US9502103B1Semiconductor memory deviceTOSHIBA KK·Filed 2016·Granted Nov 22, 2016·7 cites·17 claims
- 0589US7539055B2Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memoryTOSHIBA KK·Filed 2007·Granted May 26, 2009·15 cites·6 claims
- 0687US5463234AHigh-speed semiconductor gain memory cell with minimal area occupancyTOSHIBA KK·Filed 1995·Granted Oct 31, 1995·98 cites·16 claims
- 0786US7459748B2Semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Dec 2, 2008·17 cites·13 claims
- 0885US7393748B2Method of fabricating a semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Jul 1, 2008·10 cites·17 claims
- 0983US7528447B2Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memoryTOSHIBA KK·Filed 2006·Granted May 5, 2009·9 cites·14 claims
- 1069US5763918AESD structure that employs a schottky-barrier to reduce the likelihood of latch-upIBM·Filed 1996·Granted Jun 9, 1998·29 cites·8 claims
- 1168US7638829B2Capacitor of dynamic random access memory and method of manufacturing the capacitorTOSHIBA KK·Filed 2006·Granted Dec 29, 2009·3 cites·4 claims
- 1264US7786523B2Capacitor of dynamic random access memory and method of manufacturing the capacitorTOSHIBA KK·Filed 2009·Granted Aug 31, 2010·2 cites·8 claims
- 1364US6784006B2Semiconductor device, method of manufacturing semiconductor device, and system for evaluating electrical characteristics of semiconductor deviceTOSHIBA KK·Filed 2001·Granted Aug 31, 2004·9 cites·15 claims
- 1462US7755134B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2007·Granted Jul 13, 2010·2 cites·6 claims
- 1557US9595324B1Semiconductor memory deviceTOSHIBA KK·Filed 2016·Granted Mar 14, 2017·1 cites·17 claims
- 1645US2015261897A1Simulation method, simulation apparatus, and computer-readable recording mediumTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1740US2001025230A1Electric Characteristic evaluating apparatus for a semiconductor deviceFiled 2001·Application pending·0 cites
- 1839US2010082317A1Semiconductor device simulation apparatus, computer readable medium storing thereon program for causing computer to execute semiconductor device simulation method, and semiconductor device simulation methodKURUSU TAKASHI·Filed 2009·Application pending·0 cites
- 1937US6195790B1Electrical parameter evaluation system, electrical parameter evaluation method, and computer-readable recording medium for recording electrical parameter evaluation programTOSHIBA KK·Filed 1998·Granted Feb 27, 2001·9 cites·19 claims
- 2037US2010179792A1Monte carlo simulation method, simulation apparatus, and medium storing simulation programTOSHIBA KK·Filed 2010·Application pending·0 cites
- 2132US8610282B2Semiconductor device and method of manufacturing the sameKURUSU TAKASHI·Filed 2011·Granted Dec 17, 2013·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →