Inventor · disambiguated record
Hidetsugu Tanoue
Also filed as: TANOUE HIDETSUGU
7 granted patents·8 pending applications·24 citations·filing 2008–2023
76Inventor score
Top patents by PatentIndex Score
15 records- 0190US10168208B2Light amount detection device, immune analyzing apparatus and charged particle beam apparatus that each use the light amount detection deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 1, 2019·19 cites·7 claims
- 0274US9529009B2Automatic analyzerTANOUE HIDETSUGU·Filed 2012·Granted Dec 27, 2016·4 cites·2 claims
- 0373US10884009B2Automated analyzerHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 5, 2021·1 cites·6 claims
- 0459US11493430B2Automatic analyzer and optical measurement methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 8, 2022·0 cites·12 claims
- 0559US2025189550A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0659US2025116681A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0758US2024183871A1Automatic analysis device and analysis methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0853US2024042448A1Automatic Analyzer and Method of Storing Reagent in Automatic AnalyzerHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0952US2025224412A1Automatic analysis system and mobile terminalHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 1051US11499983B2Automatic analysis apparatus and method for controlling automatic analysis apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 15, 2022·0 cites·14 claims
- 1150US12188953B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 7, 2025·0 cites·10 claims
- 1249US7903248B2Luminescence measuring apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Mar 8, 2011·0 cites·3 claims
- 1349US2011058984A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 1441US2009022626A1Automated analyzerTANOUE HIDETSUGU·Filed 2008·Application pending·0 cites
- 1530US2013052080A1Automatic analyzerTANOUE HIDETSUGU·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →