Inventor · disambiguated record
Hironori Teguri
Also filed as: TEGURI HIRONORI
10 granted patents·4 pending applications·137 citations·filing 1992–2019
89Inventor score
Top patents by PatentIndex Score
14 records- 0178US9711172B1Magnetic recording device and reading methodTOSHIBA KK·Filed 2016·Granted Jul 18, 2017·5 cites·6 claims
- 0275US5600734AElectron beam testerFUJITSU LTD·Filed 1994·Granted Feb 4, 1997·59 cites·5 claims
- 0374US10937629B2Multi charged particle beam writing apparatus and multi charged particle beam writing methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Mar 2, 2021·1 cites·12 claims
- 0473US7324295B2Method of detecting position of head in recording medium driveFUJITSU LTD·Filed 2005·Granted Jan 29, 2008·4 cites·5 claims
- 0567US7532429B2Write-head positioning method and disk driveFUJITSU LTD·Filed 2008·Granted May 12, 2009·1 cites·6 claims
- 0661US8064155B2Storage apparatusTEGURI HIRONORI·Filed 2009·Granted Nov 22, 2011·2 cites·17 claims
- 0758US5872862AElectron beam testerFUJITSU LTD·Filed 1997·Granted Feb 16, 1999·38 cites·2 claims
- 0853US2009251822A1Magnetic recording medium and magnetic recording apparatusFUJITSU LTD·Filed 2009·Application pending·0 cites
- 0947US2007247745A1Magnetic head and magnetic disk deviceFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1045US2015138938A1Magnetic recording medium, method of manufacturing the same, and magnetic recording deviceTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1144US2014153128A1Magnetic recording medium, method of manufacturing the same, and magnetic recording/reproduction apparatusTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1241US5416426AMethod of measuring a voltage with an electron beam apparatusFUJITSU LTD·Filed 1993·Granted May 16, 1995·8 cites·1 claims
- 1339US5825912AElectron beam testerFUJITSU LTD·Filed 1997·Granted Oct 20, 1998·13 cites·1 claims
- 1436US5300880AMethod of measuring a voltage with an electron beam apparatusFUJITSU LTD·Filed 1992·Granted Apr 5, 1994·6 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →