Inventor · disambiguated record
Hirotoshi Terada
Also filed as: TERADA HIROTOSHI
36 granted patents·9 pending applications·118 citations·filing 1997–2020
96Inventor score
Top patents by PatentIndex Score
45 records- 0192US10312166B2Inspection system and inspection methodHAMAMATSU PHOTONICS KK·Filed 2016·Granted Jun 4, 2019·4 cites·13 claims
- 0289US10302569B2Microscope device and image acquisition methodHAMAMATSU PHOTONICS KK·Filed 2017·Granted May 28, 2019·3 cites·12 claims
- 0387US10578601B2Photostimulation device and photostimulation methodHAMAMATSU PHOTONICS KK·Filed 2018·Granted Mar 3, 2020·2 cites·8 claims
- 0485US10073076B2Photostimulation device and photostimulation methodHAMAMATSU PHOTONICS KK·Filed 2015·Granted Sep 11, 2018·3 cites·8 claims
- 0583US7576910B2Microscope and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2007·Granted Aug 18, 2009·8 cites·8 claims
- 0682US11391774B2Metalens unit, semiconductor fault analysis device, and semiconductor fault analysis methodHAMAMATSU PHOTONICS KK·Filed 2019·Granted Jul 19, 2022·3 cites·16 claims
- 0779US9891172B2Microscope device and image acquisition methodHAMAMATSU PHOTONICS KK·Filed 2015·Granted Feb 13, 2018·2 cites·4 claims
- 0877US8947776B2Suction apparatus, semiconductor device observation device, and semiconductor device observation methodTERADA HIROTOSHI·Filed 2011·Granted Feb 3, 2015·4 cites·12 claims
- 0976US12216263B2Scanning microscope unitHAMAMATSU PHOTONICS KK·Filed 2020·Granted Feb 4, 2025·1 cites·9 claims
- 1073US7865012B2Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Granted Jan 4, 2011·4 cites·18 claims
- 1171US10607900B2Inspection system and inspection methodHAMAMATSU PHOTONICS KK·Filed 2019·Granted Mar 31, 2020·0 cites·13 claims
- 1271US8094389B2Solid immersion lens holderTERADA HIROTOSHI·Filed 2008·Granted Jan 10, 2012·5 cites·3 claims
- 1370US6973233B1Variable-wavelength optical output deviceHAMAMATSU PHOTONICS KK·Filed 2000·Granted Dec 6, 2005·13 cites·6 claims
- 1469US9784980B2Optical module and light exposure deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Oct 10, 2017·2 cites·10 claims
- 1569US7805691B2Semiconductor failure analysis apparatus, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Granted Sep 28, 2010·6 cites·20 claims
- 1666US7149036B2Solid immersion lens and sample observation method using itHAMAMATSU PHOTONICS KK·Filed 2005·Granted Dec 12, 2006·3 cites·6 claims
- 1766US7139073B1Imaging apparatusHAMAMATSU PHOTONICS KK·Filed 2000·Granted Nov 21, 2006·10 cites·4 claims
- 1864US7576928B2Solid immersion lens holderHAMAMATSU PHOTONICS KK·Filed 2004·Granted Aug 18, 2009·8 cites·12 claims
- 1964US7312921B2Microscope and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2006·Granted Dec 25, 2007·3 cites·22 claims
- 2063US8582202B2Observing device and methodTERADA HIROTOSHI·Filed 2008·Granted Nov 12, 2013·4 cites·9 claims
- 2161US7221502B2Microscope and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2004·Granted May 22, 2007·6 cites·9 claims
- 2260US12078789B2Confocal microscope unit and confocal microscopeHAMAMATSU PHOTONICS KK·Filed 2020·Granted Sep 3, 2024·0 cites·9 claims
- 2360US7423816B2Solid immersion lens and microscopeHAMAMATSU PHOTONICS KK·Filed 2004·Granted Sep 9, 2008·2 cites·10 claims
- 2460US7359115B2Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the methodHAMAMATSU PHOTONICS KK·Filed 2004·Granted Apr 15, 2008·2 cites·10 claims
- 2559US12117600B2Confocal microscope unit and confocal microscopeHAMAMATSU PHOTONICS KK·Filed 2020·Granted Oct 15, 2024·0 cites·8 claims
- 2657US11967061B2Semiconductor apparatus examination method and semiconductor apparatus examination apparatusHAMAMATSU PHOTONICS KK·Filed 2020·Granted Apr 23, 2024·0 cites·18 claims
- 2757US2008158667A1Sample observation method, microscope, and solid immersion lens, optical contact liquid used in the methodHAMAMATSU PHOTONICS KK·Filed 2008·Application pending·0 cites
- 2856US2008137064A1Sample observation method, microscope, and solid immersion lens; optical contact liquid used in the methodHAMAMATSU PHOTONICS KK·Filed 2007·Application pending·0 cites
- 2954US7453567B2Fluorescence lifetime distribution image measuring system and its measuring methodHAMAMATSU PHOTONICS KK·Filed 2003·Granted Nov 18, 2008·2 cites·8 claims
- 3054US7230436B2Laser beam inspection equipmentHAMAMATSU PHOTONICS KK·Filed 2004·Granted Jun 12, 2007·5 cites·12 claims
- 3152US11841393B2Cooling unit, objective lens module, semiconductor inspection device, and semiconductor inspection methodHAMAMATSU PHOTONICS KK·Filed 2019·Granted Dec 12, 2023·0 cites·25 claims
- 3251US10545309B2Solid immersion lens holder and image acquisition deviceHAMAMATSU PHOTONICS KK·Filed 2015·Granted Jan 28, 2020·0 cites·8 claims
- 3350US7046449B2Solid immersion lens and sample observation method using itHAMAMATSU PHOTONICS KK·Filed 2004·Granted May 16, 2006·2 cites·10 claims
- 3449US10558010B2Solid immersion lens holder and image acquisition deviceHAMAMATSU PHOTONICS KK·Filed 2015·Granted Feb 11, 2020·0 cites·6 claims
- 3547US10495896B2Optical module and observation deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Dec 3, 2019·0 cites·5 claims
- 3647US2007146871A1Microscope and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2007·Application pending·0 cites
- 3742US2007020781A1Semiconductor failure analysis apparatus, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Application pending·0 cites
- 3841US2021333216A1Solid immersion lens unit and semiconductor inspection deviceHAMAMATSU PHOTONICS KK·Filed 2019·Application pending·0 cites
- 3940US2013100283A1Image generation deviceTERADA HIROTOSHI·Filed 2011·Application pending·0 cites
- 4040US2013120563A1Image generation deviceTERADA HIROTOSHI·Filed 2011·Application pending·0 cites
- 4138US7110172B2Microscope and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2004·Granted Sep 19, 2006·3 cites·11 claims
- 4238US2019137750A1Optical unit and method for adjusting optical unitHAMAMATSU PHOTONICS KK·Filed 2017·Application pending·0 cites
- 4337US5808746APhotodetector apparatusHAMAMATSU PHOTONICS KK·Filed 1997·Granted Sep 15, 1998·8 cites·17 claims
- 4437US2007290696A1Semiconductor failure analysis apparatus, failure analysis method, and failure analysis programHAMAMATSU PHOTONICS KK·Filed 2006·Application pending·0 cites
- 4532US8619377B2Immersion lens holding deviceARATA IKUO·Filed 2010·Granted Dec 31, 2013·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →