Inventor · disambiguated record
Hideo Todokoro
Also filed as: TODOKORO HIDEO
140 granted patents·4 pending applications·3,494 citations·filing 1975–2019
99Inventor score
Top patents by PatentIndex Score
144 records- 0199US6538249B1Image-formation apparatus using charged particle beams under various focus conditionsHITACHI LTD·Filed 2000·Granted Mar 25, 2003·118 cites·36 claims
- 0298US6847038B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Jan 25, 2005·74 cites·12 claims
- 0398US5872358AScanning electron microscopeHITACHI LTD·Filed 1996·Granted Feb 16, 1999·132 cites·29 claims
- 0498US5412210AScanning electron microscope and method for production of semiconductor device by using the sameHITACHI LTD·Filed 1993·Granted May 2, 1995·148 cites·70 claims
- 0596US7683319B2Charge control apparatus and measurement apparatus equipped with the charge control apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 23, 2010·36 cites·14 claims
- 0696US6946656B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Sep 20, 2005·56 cites·32 claims
- 0796US5900629AScanning electron microscopeHITACHI LTD·Filed 1998·Granted May 4, 1999·83 cites·31 claims
- 0896US5481109ASurface analysis method and apparatus for carrying out the sameHITACHI LTD·Filed 1993·Granted Jan 2, 1996·121 cites·80 claims
- 0995US7087899B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Aug 8, 2006·19 cites·19 claims
- 1095US7075078B2Scanning electron microscopeHITACHI LTD·Filed 2005·Granted Jul 11, 2006·20 cites·12 claims
- 1195US6646262B1Scanning electron microscopeHITACHI LTD·Filed 2000·Granted Nov 11, 2003·57 cites·18 claims
- 1295US6635873B1Scanning electron microscope with voltage applied to the sampleHITACHI LTD·Filed 2000·Granted Oct 21, 2003·45 cites·9 claims
- 1395US6310341B1Projecting type charged particle microscope and projecting type substrate inspection systemHITACHI LTD·Filed 1999·Granted Oct 30, 2001·108 cites·27 claims
- 1494US5850326ANarrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layerHITACHI LTD·Filed 1994·Granted Dec 15, 1998·45 cites·77 claims
- 1594US5412209AElectron beam apparatusHITACHI LTD·Filed 1992·Granted May 2, 1995·105 cites·32 claims
- 1694US5402295AMagnetic recording head capable of defining narrow track width and magnetic recording apparatus using the sameHITACHI LTD·Filed 1992·Granted Mar 28, 1995·72 cites·15 claims
- 1793US7372028B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2006·Granted May 13, 2008·14 cites·20 claims
- 1893US7109485B2Charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Sep 19, 2006·19 cites·5 claims
- 1993US6348690B1Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 1998·Granted Feb 19, 2002·51 cites·30 claims
- 2093US6114695AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1999·Granted Sep 5, 2000·62 cites·4 claims
- 2192US6787772B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Sep 7, 2004·32 cites·15 claims
- 2292US5608218AScanning electron microscopeHITACHI LTD·Filed 1994·Granted Mar 4, 1997·69 cites·22 claims
- 2391US6791084B2Method and scanning electron microscope for measuring dimension of material on sampleHITACHI HIGH TECH CORP·Filed 2002·Granted Sep 14, 2004·51 cites·7 claims
- 2491US6084238AScanning electron microscopeHITACHI LTD·Filed 1998·Granted Jul 4, 2000·47 cites·13 claims
- 2591US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 2691US5598002AElectron beam apparatusHITACHI LTD·Filed 1996·Granted Jan 28, 1997·68 cites·11 claims
- 2791US5594245AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1995·Granted Jan 14, 1997·71 cites·20 claims
- 2891US5389787AScanning electron microscopeHITACHI LTD·Filed 1993·Granted Feb 14, 1995·65 cites·12 claims
- 2990US7977632B2Scanning electron microscopeHITACHI LTD·Filed 2008·Granted Jul 12, 2011·8 cites·2 claims
- 3090US7700918B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2008·Granted Apr 20, 2010·8 cites·14 claims
- 3190US7642514B2Charged particle beam apparatusHITACHI LTD·Filed 2007·Granted Jan 5, 2010·14 cites·8 claims
- 3290US7282722B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 16, 2007·10 cites·10 claims
- 3390US7022986B2Apparatus and method for wafer pattern inspectionHITACHI HIGH TECH CORP·Filed 2002·Granted Apr 4, 2006·30 cites·14 claims
- 3490US6653633B2Charged particle beam apparatusHITACHI LTD·Filed 2003·Granted Nov 25, 2003·22 cites·7 claims
- 3590US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 3690US4379250AField emission cathode and method of fabricating the sameHITACHI LTD·Filed 1980·Granted Apr 5, 1983·39 cites·18 claims
- 3790US4274035AField emission electron gunHITACHI LTD·Filed 1979·Granted Jun 16, 1981·28 cites·9 claims
- 3890US4039829AStereoscopic measuring apparatusHITACHI LTD·Filed 1976·Granted Aug 2, 1977·28 cites·5 claims
- 3989US7329868B2Charged particle beam apparatusHITACHI LTD·Filed 2006·Granted Feb 12, 2008·7 cites·3 claims
- 4089US4099055AScanning transmission electron microscopeHITACHI LTD·Filed 1976·Granted Jul 4, 1978·26 cites·5 claims
- 4188US7408172B2Charged particle beam apparatus and charged particle beam irradiation methodHITACHI HIGH TECH CORP·Filed 2007·Granted Aug 5, 2008·8 cites·10 claims
- 4288US6885001B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted Apr 26, 2005·20 cites·13 claims
- 4388US6872944B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Mar 29, 2005·24 cites·6 claims
- 4488US5969357AScanning electron microscope and method for dimension measuring by using the sameHITACHI LTD·Filed 1997·Granted Oct 19, 1999·43 cites·20 claims
- 4587US7982188B2Apparatus and method for wafer pattern inspectionHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 19, 2011·9 cites·18 claims
- 4687US7825377B2Electron beam apparatus with aberration correctorHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 2, 2010·6 cites·12 claims
- 4787US7012252B2Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 2005·Granted Mar 14, 2006·5 cites·12 claims
- 4887US6839200B2Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write elementHITACHI LTD·Filed 2003·Granted Jan 4, 2005·12 cites·2 claims
- 4987US6538844B2Method of fabricating a magnetic head by focused ion beam etchingHITACHI LTD·Filed 2002·Granted Mar 25, 2003·13 cites·5 claims
- 5086US7399966B2Scanning electron microscopeHITACHI LTD·Filed 2007·Granted Jul 15, 2008·6 cites·5 claims
Showing the top 50 of 144 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →