Inventor · disambiguated record
Hiroyoshi Tomita
Also filed as: TOMITA HIROYOSHI
87 granted patents·2 pending applications·2,852 citations·filing 1993–2012
99Inventor score
Top patents by PatentIndex Score
89 records- 0198US5537354ASemiconductor memory device and method of forming the sameFUJITSU LTD·Filed 1994·Granted Jul 16, 1996·135 cites·11 claims
- 0295US5896347ASemiconductor memory system using a clock-synchronous semiconductor device and semiconductor memory device for use in the sameFUJITSU LTD·Filed 1997·Granted Apr 20, 1999·147 cites·21 claims
- 0394US6510095B1Semiconductor memory device for operating in synchronization with edge of clock signalFUJITSU LTD·Filed 2002·Granted Jan 21, 2003·86 cites·16 claims
- 0493US6907555B1Self-test circuit and memory device incorporating itFUJITSU LTD·Filed 2000·Granted Jun 14, 2005·98 cites·38 claims
- 0592US6242954B1Timing clock generation circuit using hierarchical DLL circuitFUJITSU LTD·Filed 1999·Granted Jun 5, 2001·93 cites·18 claims
- 0692US6028816ASystem configured of synchronous semiconductor device for adjusting timing of each input and semiconductor device used thereforFUJITSU LTD·Filed 1997·Granted Feb 22, 2000·85 cites·67 claims
- 0791US6304117B1Variable delay circuit and semiconductor integrated circuit deviceFUJITSU LTD·Filed 2000·Granted Oct 16, 2001·34 cites·31 claims
- 0891US6198689B1Integrated circuit device with built-in self timing control circuitFUJITSU LTD·Filed 1999·Granted Mar 6, 2001·92 cites·16 claims
- 0991US5901101ASemiconductor memory deviceFUJITSU LTD·Filed 1997·Granted May 4, 1999·88 cites·11 claims
- 1089US6369627B1Delay circuit and semiconductor integrated circuit having sameFUJITSU LTD·Filed 2000·Granted Apr 9, 2002·52 cites·37 claims
- 1189US6324113B1Semiconductor integrated circuit and method of controlling sameFUJITSU LTD·Filed 2000·Granted Nov 27, 2001·55 cites·19 claims
- 1289US6194932B1Integrated circuit deviceFUJITSU LTD·Filed 1999·Granted Feb 27, 2001·72 cites·13 claims
- 1388US6339353B1Input circuit of a memory having a lower current dissipationFUJITSU LTD·Filed 2000·Granted Jan 15, 2002·33 cites·12 claims
- 1488US6295245B1Write data input circuitFUJITSU LTD·Filed 1999·Granted Sep 25, 2001·69 cites·19 claims
- 1588US6064625ASemiconductor memory device having a short write timeFUJITSU LTD·Filed 1997·Granted May 16, 2000·71 cites·20 claims
- 1687US6078514ASemiconductor device and semiconductor system for high-speed data transferFUJITSU LTD·Filed 1998·Granted Jun 20, 2000·89 cites·43 claims
- 1787US6075393AClock synchronous semiconductor device system and semiconductor devices used with the sameFUJITSU LTD·Filed 1997·Granted Jun 13, 2000·68 cites·14 claims
- 1886US7109775B2Delay circuit having reduced power supply voltage dependencyFUJITSU LTD·Filed 2005·Granted Sep 19, 2006·15 cites·20 claims
- 1986US6671787B2Semiconductor memory device and method of controlling the sameFUJITSU LTD·Filed 1999·Granted Dec 30, 2003·52 cites·27 claims
- 2086US6252804B1Semiconductor integrated circuit, and method of controlling sameFUJITSU LTD·Filed 2000·Granted Jun 26, 2001·42 cites·9 claims
- 2185US6426909B1Semiconductor memoryFUJITSU LTD·Filed 2001·Granted Jul 30, 2002·38 cites·9 claims
- 2285US6318707B1Semiconductor integrated circuit deviceFUJITSU LTD·Filed 2000·Granted Nov 20, 2001·38 cites·5 claims
- 2384US7319349B2Semiconductor integrated circuitFUJITSU LTD·Filed 2005·Granted Jan 15, 2008·15 cites·10 claims
- 2484US6307806B1Semiconductor integrated circuit and method of operating the sameFUJITSU LTD·Filed 2000·Granted Oct 23, 2001·35 cites·41 claims
- 2584US6181174B1Semiconductor integrated circuit deviceFUJITSU LTD·Filed 1999·Granted Jan 30, 2001·113 cites·8 claims
- 2684US6115322ASemiconductor device accepting data which includes serial data signals, in synchronization with a data strobe signalFUJITSU LTD·Filed 1999·Granted Sep 5, 2000·53 cites·18 claims
- 2783US6373783B1Semiconductor integrated circuit, method of controlling the same, and variable delay circuitFUJITSU LTD·Filed 2000·Granted Apr 16, 2002·29 cites·22 claims
- 2883US6108793ASemiconductor device having timing-stabilization circuit and method of testing such semiconductor deviceFUJITSU LTD·Filed 1998·Granted Aug 22, 2000·52 cites·73 claims
- 2982US6288585B1Semiconductor device using external power voltage for timing sensitive signalsFUJITSU LTD·Filed 2000·Granted Sep 11, 2001·32 cites·10 claims
- 3082US6066969ASemiconductor device with DLL circuit avoiding excessive power consumptionFUJITSU LTD·Filed 1998·Granted May 23, 2000·50 cites·10 claims
- 3182US6063640ASemiconductor wafer testing method with probe pin contactFUJITSU LTD·Filed 1998·Granted May 16, 2000·68 cites·31 claims
- 3281US6759884B2Semiconductor integrated circuit, method of controlling the same, and variable delay circuitFUJITSU LTD·Filed 2002·Granted Jul 6, 2004·25 cites·1 claims
- 3381US6522182B2Integrated circuit device incorporating DLL circuitFUJITSU LTD·Filed 1999·Granted Feb 18, 2003·41 cites·30 claims
- 3481US6317372B1Semiconductor memory device equipped with serial/parallel conversion circuitry for testing memory cellsFUJITSU LTD·Filed 2000·Granted Nov 13, 2001·30 cites·13 claims
- 3578US6973001B1Semiconductor integrated circuit capable of adjusting the operation timing of an internal circuit based on operating environmentsFUJITSU LTD·Filed 2005·Granted Dec 6, 2005·9 cites·13 claims
- 3678US6813696B2Semiconductor memory device and method of controlling the sameFUJITSU LTD·Filed 2003·Granted Nov 2, 2004·22 cites·4 claims
- 3778US6320819B2Semiconductor device reconciling different timing signalsFUJITSU LTD·Filed 2000·Granted Nov 20, 2001·22 cites·6 claims
- 3878US6181184B1Variable delay circuit and semiconductor intergrated circuit deviceFUJITSU LTD·Filed 1998·Granted Jan 30, 2001·32 cites·4 claims
- 3977US6549047B2Variable delay circuit and semiconductor integrated circuit deviceFUJITSU LTD·Filed 2001·Granted Apr 15, 2003·18 cites·31 claims
- 4077US6333660B2Semiconductor device using complementary clock and signal input state detection circuit used for the sameFUJITSU LTD·Filed 2001·Granted Dec 25, 2001·13 cites·11 claims
- 4177US6292428B1Semiconductor device reconciling different timing signalsFUJITSU LTD·Filed 1999·Granted Sep 18, 2001·34 cites·42 claims
- 4276US7898890B2Oscillating device, method of adjusting the same and memoryFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Mar 1, 2011·9 cites·11 claims
- 4376US6266294B1Integrated circuit deviceFUJITSU LTD·Filed 1999·Granted Jul 24, 2001·44 cites·6 claims
- 4474US6661728B2Supply voltage generating circuit and semiconductor memory device using sameFUJITSU LTD·Filed 2002·Granted Dec 9, 2003·20 cites·11 claims
- 4574US6397312B1Memory subsystem operated in synchronism with a clockFUJITSU LTD·Filed 1997·Granted May 28, 2002·69 cites·16 claims
- 4674US6208582B1Memory device including a double-rate input/output circuitFUJITSU LTD·Filed 1999·Granted Mar 27, 2001·35 cites·10 claims
- 4774US6205082B1LSI device with memory and logics mounted thereonFUJITSU LTD·Filed 1999·Granted Mar 20, 2001·38 cites·20 claims
- 4873US8351247B2Semiconductor device including memory cell having capacitorFUJITSU SEMICONDUCTOR LTD·Filed 2010·Granted Jan 8, 2013·3 cites·11 claims
- 4973US7626881B2Semiconductor memory device containing antifuse write voltage generation circuitFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Dec 1, 2009·8 cites·16 claims
- 5073US5939913ADLL circuit and semiconductor memory device using sameFUJITSU LTD·Filed 1998·Granted Aug 17, 1999·36 cites·9 claims
Showing the top 50 of 89 patent records by PatentIndex Score.
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