Inventor · disambiguated record
Hiroshi Toyama
Also filed as: TOYAMA HIROSHI
54 granted patents·11 pending applications·280 citations·filing 1998–2023
98Inventor score
Top patents by PatentIndex Score
65 records- 0196US7863614B2LED backlight device and LCD deviceOKI DATA KK·Filed 2008·Granted Jan 4, 2011·31 cites·25 claims
- 0293US6348690B1Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 1998·Granted Feb 19, 2002·51 cites·30 claims
- 0392US11173727B2Printing apparatus and printing methodSEIKO EPSON CORP·Filed 2020·Granted Nov 16, 2021·2 cites·5 claims
- 0488US11844208B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 12, 2023·1 cites·5 claims
- 0588US7405743B2Image forming method and apparatusSEIKO EPSON CORP·Filed 2006·Granted Jul 29, 2008·10 cites·2 claims
- 0687US7012252B2Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 2005·Granted Mar 14, 2006·5 cites·12 claims
- 0785US10093116B2Printing apparatus and printing methodSEIKO EPSON CORP·Filed 2017·Granted Oct 9, 2018·2 cites·11 claims
- 0885US7884374B2LED backlight device and LCD deviceOKI DATA KK·Filed 2008·Granted Feb 8, 2011·8 cites·12 claims
- 0985US6452178B2Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 2001·Granted Sep 17, 2002·23 cites·16 claims
- 1083US7058326B2Color image forming apparatusSEIKO EPSON CORP·Filed 2003·Granted Jun 6, 2006·20 cites·11 claims
- 1182US11211347B2Integrated circuit structures and methods of forming an opening in a materialMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 28, 2021·1 cites·6 claims
- 1282US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 1381US7944463B2Light scanning apparatus, image forming apparatus equipped with such light scanning apparatus, and control method or image forming method for such image forming apparatusSEIKO EPSON CORP·Filed 2009·Granted May 17, 2011·7 cites·5 claims
- 1480US10943841B2Substrates, structures within a scribe-line area of a substrate, and methods of forming a conductive line of a redistribution layer of a substrate and of forming a structure within a scribe-line area of the substrateMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 9, 2021·1 cites·5 claims
- 1580US7439506B2Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 2007·Granted Oct 21, 2008·3 cites·30 claims
- 1679US7083097B2Optical information reading apparatusDENSO ELECS CO LTD·Filed 2004·Granted Aug 1, 2006·39 cites·8 claims
- 1777US11148223B2Laser beam machine and alignment adjusting meihodMAKINO MILLING MACHINE·Filed 2015·Granted Oct 19, 2021·2 cites·5 claims
- 1877US10847482B2Integrated circuit structures and methods of forming an opening in a materialMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 24, 2020·2 cites·31 claims
- 1976US8023847B2Image forming apparatus and image forming methodSEIKO EPSON CORP·Filed 2009·Granted Sep 20, 2011·4 cites·15 claims
- 2074US6512227B2Method and apparatus for inspecting patterns of a semiconductor device with an electron beamHITACHI LTD·Filed 2001·Granted Jan 28, 2003·10 cites·17 claims
- 2171US10651100B2Substrates, structures within a scribe-line area of a substrate, and methods of forming a conductive line of a redistribution layer of a substrate and of forming a structure within a scribe-line area of the substrateMICRON TECHNOLOGY INC·Filed 2018·Granted May 12, 2020·1 cites·17 claims
- 2271US7508407B2Light scanning apparatus, image forming apparatus equipped with such light scanning apparatus, and control method or image forming method for such image forming apparatusSEIKO EPSON CORP·Filed 2006·Granted Mar 24, 2009·3 cites·6 claims
- 2371US6987265B2Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 2002·Granted Jan 17, 2006·9 cites·12 claims
- 2470US7920156B2Image forming apparatus, image forming method and data control deviceSEIKO EPSON CORP·Filed 2008·Granted Apr 5, 2011·2 cites·16 claims
- 2570US7884371B2LED backlight device and LCD deviceOKI DATA KK·Filed 2008·Granted Feb 8, 2011·4 cites·33 claims
- 2669US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 2769US7626606B2Light scanning apparatus, image forming apparatus equipped with such light scanning apparatus, and control method or image forming method for such image forming apparatusSEIKO EPSON CORP·Filed 2008·Granted Dec 1, 2009·2 cites·14 claims
- 2868US8421710B2Light source apparatus and head-up display apparatus incorporating the light source apparatusNAKAMURA YUKIO·Filed 2010·Granted Apr 16, 2013·2 cites·7 claims
- 2967US8023070B2LED backlight device and LCD deviceOKI DATA KK·Filed 2008·Granted Sep 20, 2011·2 cites·24 claims
- 3066US11267272B2Printing apparatusSEIKO EPSON CORP·Filed 2020·Granted Mar 8, 2022·0 cites·11 claims
- 3166US11007603B2Laser beam machine and alignment adjusting methodMAKINO MILLING MACHINE·Filed 2015·Granted May 18, 2021·1 cites·9 claims
- 3262US9627999B2Power supply deviceVOLVO TRUCK CORP·Filed 2012·Granted Apr 18, 2017·2 cites·10 claims
- 3362US8013952B2LED backlight device and LCD deviceOKI DATA KK·Filed 2008·Granted Sep 6, 2011·1 cites·27 claims
- 3461US8816712B2Inspection deviceNAKAMURA MITSUHIRO·Filed 2009·Granted Aug 26, 2014·4 cites·9 claims
- 3560US8134125B2Method and apparatus of an inspection system using an electron beamIWABUCHI YUKO·Filed 2008·Granted Mar 13, 2012·0 cites·18 claims
- 3659US7232996B2Method and an apparatus of an inspection system using an electron beamHITACHI LTD·Filed 2005·Granted Jun 19, 2007·0 cites·12 claims
- 3759US6888138B2Absorption current image apparatus in electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted May 3, 2005·3 cites·13 claims
- 3858US7834897B2Optical scanning apparatus, control method of such apparatus, and image forming apparatusSEIKO EPSON CORP·Filed 2007·Granted Nov 16, 2010·1 cites·13 claims
- 3957US8604430B2Method and an apparatus of an inspection system using an electron beamIWABUCHI YUKO·Filed 2012·Granted Dec 10, 2013·0 cites·6 claims
- 4056US12240225B2Printing apparatusSEIKO EPSON CORP·Filed 2023·Granted Mar 4, 2025·0 cites·10 claims
- 4156US8451197B2Information display apparatus having a plurality of thin-film light-emitting diodesNAKAMURA YUKIO·Filed 2008·Granted May 28, 2013·0 cites·21 claims
- 4256US8120634B2Image forming apparatus, image forming method and data control deviceNOMURA YUJIRO·Filed 2011·Granted Feb 21, 2012·0 cites·3 claims
- 4352US7815276B2Image forming method and apparatusSEIKO EPSON CORP·Filed 2008·Granted Oct 19, 2010·0 cites·6 claims
- 4452US2024208246A1Printing device and printing methodSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 4552US2024208245A1Printing device and printing methodSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 4651US7041423B2Developing method and image forming methodSEIKO EPSON CORP·Filed 2003·Granted May 9, 2006·4 cites·11 claims
- 4750US6730449B2Toner and image forming apparatus using the sameSEIKO EPSON CORP·Filed 2003·Granted May 4, 2004·3 cites·14 claims
- 4848US2006017795A1Image forming apparatus, image forming method and data control deviceSEIKO EPSON CORP·Filed 2005·Application pending·0 cites
- 4945US10525738B2Transporting medium through drying unit during printing interruptionSEIKO EPSON CORP·Filed 2018·Granted Jan 7, 2020·0 cites·7 claims
- 5044US9831671B2Power supply deviceVOLVO TRUCK CORP·Filed 2012·Granted Nov 28, 2017·0 cites·5 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →