Inventor · disambiguated record
Hiroshi Uchihara
Also filed as: UCHIHARA HIROSHI
10 granted patents·4 pending applications·30 citations·filing 1988–2021
83Inventor score
Top patents by PatentIndex Score
14 records- 0175US6516654B2Apparatus and method for analyzing particulate matter in gas and apparatus and method for carbon differentiatingHORIBA LTD·Filed 2000·Granted Feb 11, 2003·16 cites·7 claims
- 0273US10978285B2Element analysis device and element analysis methodHORIBA LTD·Filed 2017·Granted Apr 13, 2021·1 cites·11 claims
- 0369US8102524B2Degree-of-dispersion determination method for single-walled carbon nanotubes and degree-of-dispersion determination apparatus for single-walled carbon nanotubesNAKATA YASUSHI·Filed 2009·Granted Jan 24, 2012·3 cites·8 claims
- 0464US12467912B2Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis deviceHORIBA LTD·Filed 2021·Granted Nov 11, 2025·0 cites·12 claims
- 0559US12228554B2Elemental analysis deviceHORIBA LTD·Filed 2021·Granted Feb 18, 2025·0 cites·13 claims
- 0657US7387764B2Contained oxygen analyzing apparatus and contained analyzing methodHORIBA LTD·Filed 2003·Granted Jun 17, 2008·2 cites·14 claims
- 0755US12253443B2Elemental analysis device for analyzing test sample having cleaning gas supply mechanismHORIBA LTD·Filed 2021·Granted Mar 18, 2025·0 cites·17 claims
- 0855US2023213419A1Element analysis device, mounting jig, and mounting methodHORIBA LTD·Filed 2021·Application pending·0 cites
- 0955US2023204550A1Elemental analysis device, method for operating elemental analysis device, and non-transitory computer readable medium storing program for operating elemental analysis deviceHORIBA LTD·Filed 2021·Application pending·0 cites
- 1051US12111254B2Sample analyzing apparatusHORIBA LTD·Filed 2020·Granted Oct 8, 2024·0 cites·6 claims
- 1145US2021318267A1Element analysis device and element analysis methodHORIBA LTD·Filed 2019·Application pending·0 cites
- 1244US11270878B2Quadrupole mass spectrometer, quadrupole mass spectrometry method, and program storage medium storing program for quadrupole mass spectrometerHORIBA STEC CO LTD·Filed 2020·Granted Mar 8, 2022·0 cites·9 claims
- 1342US2005239211A1Concentration method and apparatus of preparing a liquid specimen for a trace element analysis systemUCHIHARA HIROSHI·Filed 2005·Application pending·0 cites
- 1440US4800747AMethod of measuring oxygen in siliconHORIBA LTD·Filed 1988·Granted Jan 31, 1989·8 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →