Inventor · disambiguated record
Hidenori Yamaguchi
Also filed as: YAMAGUCHI HIDENORI
20 granted patents·12 pending applications·161 citations·filing 1974–2025
92Inventor score
Files withMICRON TECHNOLOGY INC16ELPIDA MEMORY INC5HITACHI LTD4AVANTEC VASCULAR CORP2SHINETSU CHEMICAL CO2
Top patents by PatentIndex Score
32 records- 0193US4012843AConcave diffraction grating and a manufacturing method thereofHITACHI LTD·Filed 1974·Granted Mar 22, 1977·68 cites·7 claims
- 0285US5209813ALithographic apparatus and methodHITACHI LTD·Filed 1991·Granted May 11, 1993·53 cites·55 claims
- 0383US12396166B2Semiconductor device and method for forming the wiring structures avoiding short circuit thereofMICRON TECHNOLOGY INC·Filed 2024·Granted Aug 19, 2025·0 cites·20 claims
- 0472US12125789B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 22, 2024·0 cites·16 claims
- 0569US7549543B2Cylindrical sieveTSUKASA KASEI KOGYO·Filed 2008·Granted Jun 23, 2009·3 cites·10 claims
- 0667US5324550APattern forming methodHITACHI LTD·Filed 1992·Granted Jun 28, 1994·21 cites·13 claims
- 0766US12217816B2Semiconductor wiring device and methodMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 4, 2025·0 cites·17 claims
- 0865US11456253B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 27, 2022·0 cites·7 claims
- 0964US2022406792A1Semiconductor device and method for forming the wiring structures avoiding short circuit thereofMICRON TECHNOLOGY INC·Filed 2021·Application pending·0 cites
- 1058US5166529AElectron beam lithography systemHITACHI LTD·Filed 1991·Granted Nov 24, 1992·14 cites·15 claims
- 1157US11569089B2Method of forming a semiconductor device, and a photomask used thereinMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 31, 2023·0 cites·13 claims
- 1257US2025372377A1Metal-containing film patterning processSHINETSU CHEMICAL CO·Filed 2025·Application pending·0 cites
- 1357US2025372378A1Patterning ProcessSHINETSU CHEMICAL CO·Filed 2025·Application pending·0 cites
- 1456US11769736B2Scribe structure for memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 26, 2023·0 cites·15 claims
- 1555US11658121B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2020·Granted May 23, 2023·0 cites·14 claims
- 1655US11600578B2Scribe structure for memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Mar 7, 2023·0 cites·16 claims
- 1753US2023377967A1Method of forming through silicon via and trench using the same mask layerMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 1852US11581278B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 14, 2023·0 cites·11 claims
- 1952US2023290720A1Apparatuses including metal-insulator-metal capacitor and methods for forming sameMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 2051US12414785B1Cutters with pulsating vacuum controlAVANTEC VASCULAR CORP·Filed 2025·Granted Sep 16, 2025·0 cites·20 claims
- 2151US2024071972A1Semiconductor conductive pillar device and methodMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 2248US11715704B2Scribe structure for memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 1, 2023·0 cites·14 claims
- 2348US7410064B2Circular-cylinder sieveTSUKASA KASEI KOGYO·Filed 2003·Granted Aug 12, 2008·2 cites·10 claims
- 2447US12050398B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 30, 2024·0 cites·10 claims
- 2546US11764164B2Semiconductor device and method of forming the sameMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 19, 2023·0 cites·14 claims
- 2646US2021085332A1System and method for unsheathing and resheathing an embolic device delivery systemAVANTEC VASCULAR CORP·Filed 2019·Application pending·0 cites
- 2744US2008106716A1Photomask, exposure method and apparatus that use the same, and semiconductor deviceELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
- 2843US2008036986A1Photomask, method and apparatus that uses the same, photomask pattern production method, pattern formation method, and semiconductor deviceELPIDA MEMORY INC·Filed 2006·Application pending·0 cites
- 2942US2007194466A1Overlay measurement mark and pattern formation method for the sameELPIDA MEMORY INC·Filed 2007·Application pending·0 cites
- 3041US12121383B2X-ray diagnostic apparatus and control methodTOSHIBA MEDICAL SYS CORP·Filed 2017·Granted Oct 22, 2024·0 cites·20 claims
- 3138US2013020721A1Semiconductor device and method for manufacturing the sameELPIDA MEMORY INC·Filed 2012·Application pending·0 cites
- 3236US2010247770A1Method for applying coating liquid, method for forming coated film, method for forming a pattern by using the same, and method for manufacturing semiconductor deviceELPIDA MEMORY INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →