Inventor · disambiguated record
Hirokazu Yamazaki
Also filed as: YAMAZAKI HIROKAZU
12 granted patents·146 citations·filing 1991–2010
92Inventor score
Top patents by PatentIndex Score
12 records- 0175US5402380ANonvolatile semiconductor memory device having a status register and test method for the sameFUJITSU LTD·Filed 1994·Granted Mar 28, 1995·27 cites·2 claims
- 0268US7545186B2Reset circuitFUJITSU MICROELECTRONCIS LTD·Filed 2004·Granted Jun 9, 2009·15 cites·25 claims
- 0367US5566386ANonvolatile semiconductor memory device having a status register and test method for the sameFUJITSU LTD·Filed 1995·Granted Oct 15, 1996·19 cites·3 claims
- 0461US5469394ANonvolatile semiconductor memory device having a status register and test method for the sameFUJITSU LTD·Filed 1994·Granted Nov 21, 1995·14 cites·6 claims
- 0559US6496428B2Semiconductor memoryFUJITSU LTD·Filed 2001·Granted Dec 17, 2002·12 cites·26 claims
- 0657US5592427ASemiconductor memory having a sense amplifier with load transistors having different load characteristicsFUJITSU LTD·Filed 1995·Granted Jan 7, 1997·12 cites·1 claims
- 0754US6777736B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2001·Granted Aug 17, 2004·6 cites·16 claims
- 0854US5149990ASemiconductor device for preventing malfunction caused by a noiseFUJITSU LTD·Filed 1991·Granted Sep 22, 1992·16 cites·19 claims
- 0950US6229728B1Ferroelectric memory and method of testing the sameFUJITSU LTD·Filed 1999·Granted May 8, 2001·13 cites·8 claims
- 1044US6072724ASemiconductor integrated circuit for generating plurality of different reference levelsFUJITSU LTD·Filed 1997·Granted Jun 6, 2000·9 cites·16 claims
- 1132US5469381ASemiconductor memory having non-volatile semiconductor memory cellFUJITSU LTD·Filed 1992·Granted Nov 21, 1995·3 cites·15 claims
- 1221US8542041B2Semiconductor device and systemOGAI MITSUHIRO·Filed 2010·Granted Sep 24, 2013·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →