Inventor · disambiguated record
Hiroaki Yanagimoto
Also filed as: YANAGIMOTO HIROAKI
6 granted patents·3 pending applications·54 citations·filing 1990–2007
82Inventor score
Files withHITACHI CONSTRUCTION MACHINERY2HITACHI KENKI FINE TECH CO LTD2HITACHI KENKI FINETECH CO LTD1KURENUMA TOORU1KURENUMA TORU1
Top patents by PatentIndex Score
9 records- 0157US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 0256US5293326AUltrasonic inspection and imaging instrumentHITACHI CONSTRUCTION MACHINERY·Filed 1991·Granted Mar 8, 1994·24 cites·14 claims
- 0346US7388199B2Probe manufacturing method, probe, and scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jun 17, 2008·5 cites·17 claims
- 0444US2008087820A1Probe control method for scanning probe microscopeKURENUMA TORU·Filed 2007·Application pending·0 cites
- 0543US7350404B2Scanning type probe microscope and probe moving control method thereforHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Apr 1, 2008·3 cites·4 claims
- 0642USD328714SUltrasonic flaw detectorNAKAJIMA HIROAKI·Filed 1990·Granted Aug 18, 1992·4 cites·1 claims
- 0734US2008236259A1Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe MicroscopeKURENUMA TOORU·Filed 2005·Application pending·0 cites
- 0833US2007180889A1Probe replacement method for scanning probe microscopeMURAYAMA KEN·Filed 2004·Application pending·0 cites
- 0932US5179954AUltrasonic inspection and imaging instrumentHITACHI CONSTRUCTION MACHINERY·Filed 1991·Granted Jan 19, 1993·7 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →