Inventor · disambiguated record
Hirotomo Yashima
Also filed as: YASHIMA HIROTOMO
3 granted patents·19 citations·filing 2017–2019
60Inventor score
Files withNIKON CORP3
Top patents by PatentIndex Score
3 records- 0190US10809208B2X-ray inspection device, X-ray inspection method, and method of manufacturing structureNIKON CORP·Filed 2017·Granted Oct 20, 2020·19 cites·22 claims
- 0261US10809209B2Measurement processing device, x-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing methodNIKON CORP·Filed 2019·Granted Oct 20, 2020·0 cites·10 claims
- 0355US10481106B2Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing methodNIKON CORP·Filed 2017·Granted Nov 19, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →