Inventor · disambiguated record
Horst Baumeister
Also filed as: BAUMEISTER HORST
6 granted patents·22 citations·filing 2001–2021
74Inventor score
Top patents by PatentIndex Score
6 records- 0186US7973547B2Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuckINFINEON TECHNOLOGIES AG·Filed 2008·Granted Jul 5, 2011·18 cites·23 claims
- 0262US9793220B2Detection of environmental conditions in a semiconductor chipBARTH HANS-JOACHIM·Filed 2012·Granted Oct 17, 2017·2 cites·21 claims
- 0349US12439616B2Integrated circuit package redistribution layers with metal-insulator-metal (MIM) capacitorsINTEL CORP·Filed 2021·Granted Oct 7, 2025·0 cites·23 claims
- 0441US6794209B2Method for the in-situ fabrication of DFB lasersINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 21, 2004·1 cites·13 claims
- 0541US6699778B2Masking method for producing semiconductor components, particularly a BH laser diodeINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 2, 2004·1 cites·25 claims
- 0632US6599843B2In-situ mask technique for producing III-V semiconductor componentsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jul 29, 2003·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →