Inventor · disambiguated record
Ho-Jeong Choi
Also filed as: CHOI HO-JEONG
14 granted patents·7 pending applications·97 citations·filing 2000–2025
90Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11HYUNDAI MOTOR CO LTD3SFC CO LTD2HAN JONG-WON1INNOCOMPANY CO LTD1
Top patents by PatentIndex Score
21 records- 0183US6541290B1Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 1, 2003·34 cites·13 claims
- 0282USD1033294SRear bumper cover for an automobileHYUNDAI MOTOR CO LTD·Filed 2022·Granted Jul 2, 2024·8 cites·1 claims
- 0379US8564317B2Test socket, and test apparatus with test socket to control a temperature of an object to be testedHAN JONG-WON·Filed 2010·Granted Oct 22, 2013·6 cites·13 claims
- 0476US6682959B2Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 27, 2004·22 cites·15 claims
- 0562US7492032B2Fuse regions of a semiconductor memory device and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 17, 2009·4 cites·17 claims
- 0661US7786721B2Multilayer type test board assembly for high-precision inspectionSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 31, 2010·1 cites·11 claims
- 0760US2025380564A1Organic light-emitting diode with low voltage, high efficiency, and long lifespanSFC CO LTD·Filed 2025·Application pending·0 cites
- 0859US2025011306A1Organic compounds and organic light-emitting device comprising the sameSFC CO LTD·Filed 2024·Application pending·0 cites
- 0958US6850450B2Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cellSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Feb 1, 2005·10 cites·15 claims
- 1057US7323891B2Method of testing a semiconductor chip and jig used in the methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 29, 2008·3 cites·20 claims
- 1155US6861682B2Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 1, 2005·7 cites·14 claims
- 1254US7659735B2Probe card capable of multi-probingKIM MIN-GU·Filed 2006·Granted Feb 9, 2010·1 cites·12 claims
- 1351USD1028809SRadiator grill for an automobileHYUNDAI MOTOR CO LTD·Filed 2022·Granted May 28, 2024·1 cites·1 claims
- 1446US2008164894A1System and method for testing semiconductor integrated circuit in parallelSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1545US2009009204A1Test socketSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1641US10414451B2Air passage type wheel deflector and vehicle having the sameHYUNDAI MOTOR CO LTD·Filed 2017·Granted Sep 17, 2019·0 cites·9 claims
- 1740US8139949B2Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the sameLEE SANG-HOON·Filed 2008·Granted Mar 20, 2012·0 cites·13 claims
- 1839US2008164898A1Probe card for test of semiconductor chips and method for test of semiconductor chips using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1937US11454384B2LED lighting lamp with enhanced heat dissipation functionINNOCOMPANY CO LTD·Filed 2018·Granted Sep 27, 2022·0 cites·4 claims
- 2034US2008164893A1Probe card for testing waferSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 2134US2010176796A1Apparatus for testing electrical characteristicsKIM DONG-DAE·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →