Inventor · disambiguated record
Hong-Shin Jun
Also filed as: JUN HONG · JUN HONG-SHIN
7 granted patents·1 pending application·201 citations·filing 1997–2015
87Inventor score
Top patents by PatentIndex Score
8 records- 0188US6658611B1Programmable built-in self-test system for semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Dec 2, 2003·89 cites·6 claims
- 0283US7536617B2Programmable in-situ delay fault test clock generatorCISCO TECH INC·Filed 2005·Granted May 19, 2009·15 cites·17 claims
- 0377US5946246ASemiconductor memory device with built-in self test circuitSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Aug 31, 1999·42 cites·20 claims
- 0474US7844875B2Programmable test clock generation responsive to clock signal characterizationCISCO TECH INC·Filed 2008·Granted Nov 30, 2010·7 cites·19 claims
- 0565US6603691B2Semiconductor device including built-in redundancy analysis circuit for simultaneously testing and analyzing failure of a plurality of memories and method for analyzing the failure of the plurality of memoriesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Aug 5, 2003·17 cites·11 claims
- 0657US6148426AApparatus and method for generating addresses in a SRAM built-in self test circuit using a single-direction counterSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Nov 14, 2000·22 cites·20 claims
- 0754US6742151B2Semiconductor integrated circuit device with scan signal converting circuitSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 25, 2004·9 cites·21 claims
- 0831US2016055243A1Web crawler for acquiring contentUT BATTELLE LLC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →