Inventor · disambiguated record
Hoon Kim
Also filed as: KIM HOON · KIM HOON-JUNG
17 granted patents·6 pending applications·80 citations·filing 1998–2025
92Inventor score
Top patents by PatentIndex Score
23 records- 0192US7192873B1Method of manufacturing nano scale semiconductor device using nano particlesSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 20, 2007·23 cites·21 claims
- 0287US8049217B2Display deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 1, 2011·8 cites·30 claims
- 0381US8568944B2Reflective extreme ultraviolet mask and method of manufacturing the sameKIM HOON·Filed 2012·Granted Oct 29, 2013·4 cites·18 claims
- 0479US7915820B2Display device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 29, 2011·8 cites·7 claims
- 0578US7488977B2Display device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 10, 2009·4 cites·23 claims
- 0675US2025341540A1Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0774US7745072B2Method of correcting critical dimension in photomask and photomask having corrected critical dimension using the methodSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 29, 2010·4 cites·24 claims
- 0873US8044404B2Display apparatus and manufacturing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 25, 2011·3 cites·12 claims
- 0969US7274513B2Off-axis projection optics and extreme ultraviolet lithography apparatus employing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 25, 2007·2 cites·9 claims
- 1068US7888956B2Apparatus for testing a semiconductor device and a method of fabricating and using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 15, 2011·4 cites·19 claims
- 1163US7301694B2Off-axis projection optical system and extreme ultraviolet lithography apparatus using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 27, 2007·1 cites·18 claims
- 1261US8968970B2Phase shift masks and methods of forming phase shift masksSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Mar 3, 2015·1 cites·13 claims
- 1356US8865375B2Halftone phase shift blank photomasks and halftone phase shift photomasksSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Oct 21, 2014·0 cites·19 claims
- 1455US2009206856A1Wafer burn-in system with probe coolingSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 1553US7474468B2Off-axis projection optics and extreme ultraviolet lithography apparatus employing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jan 6, 2009·0 cites·8 claims
- 1652US6333635B1Probe card for testing an integrated circuit chipSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Dec 25, 2001·18 cites·18 claims
- 1751US11086210B2Photomask, method of fabricating the same, and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Aug 10, 2021·0 cites·20 claims
- 1846US8329363B2Methods of fabricating halftone phase shift blank photomasks and halftone phase shift photomasksJANG IL-YONG·Filed 2010·Granted Dec 11, 2012·0 cites·16 claims
- 1944US2006152239A1Wafer burn-in system with probe coolingNAM JUNG-HYUN·Filed 2006·Application pending·0 cites
- 2043US2007031741A1EUVL reflection device, method of fabricating the same, and mask, projection optics system and EUVL apparatus using the EUVL reflection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 2143US2009278561A1Probe card having redistributed wiring probe needle structure and probe card module using the sameJO CHA-JEA·Filed 2008·Application pending·0 cites
- 2240US8361679B2Phase shift masksSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Jan 29, 2013·0 cites·19 claims
- 2339US2006170437A1Probe card for testing a plurality of semiconductor chips and method thereofYOO SANG-KYU·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →