Inventor · disambiguated record
Hoo-Sung Kim
Also filed as: KIM HOO-SUNG
7 granted patents·2 pending applications·102 citations·filing 2001–2009
84Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4LG PHILIPS LCD CO LTD2KIM HOO-SUNG1KIM KIL-YEON1LG DISPLAY CO LTD1
Top patents by PatentIndex Score
9 records- 0193US7813184B2Multi-block memory device erasing methods and related memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 12, 2010·57 cites·31 claims
- 0282US6690433B2Electrostatic damage preventing apparatus for liquid crystal displayLG PHILIPS LCD CO LTD·Filed 2001·Granted Feb 10, 2004·24 cites·22 claims
- 0368US8089804B2Non-volatile semiconductor memory device using weak cells as reading identifierKIM HOO-SUNG·Filed 2007·Granted Jan 3, 2012·9 cites·6 claims
- 0459US7173684B2Liquid crystal display device having more uniform seal heights and its fabricating methodLG PHILIPS LCD CO LTD·Filed 2001·Granted Feb 6, 2007·5 cites·16 claims
- 0557US7843736B2Nonvolatile memory device and read method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Nov 30, 2010·4 cites·20 claims
- 0655US7457160B2Methods of applying read voltages in NAND flash memory arraysSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 25, 2008·3 cites·10 claims
- 0752US7705955B2Liquid crystal display device having more uniform seal heights and its fabricating methodLG DISPLAY CO LTD·Filed 2006·Granted Apr 27, 2010·0 cites·7 claims
- 0837US2009052252A1Methods of applying read voltages in nand flash memory arraysSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0933US2006028227A1Self-isolation semiconductor wafer and test method thereofKIM KIL-YEON·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →