Inventor · disambiguated record
Hsin-Cheng Chen
Also filed as: CHEN HSIN-CHENG
31 granted patents·8 pending applications·153 citations·filing 2003–2024
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11WANG BILY7MEDIATEK INC4CHEN HSIN-CHENG3YOUNGTEK ELECTRONICS CORP3
Top patents by PatentIndex Score
39 records- 0195US8031930B2Testing system and testing method for inspecting electonic devicesYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Oct 4, 2011·64 cites·17 claims
- 0295US7861141B2Method and device for error analysis of optical discMEDIATEK INC·Filed 2006·Granted Dec 28, 2010·37 cites·11 claims
- 0389US7142135B1Modulation methods and systemsMEDIA TEK INC·Filed 2005·Granted Nov 28, 2006·10 cites·42 claims
- 0481US10867669B2Serialized SRAM access to reduce congestionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 15, 2020·1 cites·20 claims
- 0581US7378994B1EFM/EFM+ encoder and method thereofMEDIATEK INC·Filed 2007·Granted May 27, 2008·5 cites·22 claims
- 0681US2024394440A1Function safety and fault management modeling at electrical system level (esl)TAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0780US10776538B2Function safety and fault management modeling at electrical system level (ESL)TAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 15, 2020·2 cites·20 claims
- 0880US7423561B2Modulation methods and systemsMEDIATECK INC·Filed 2007·Granted Sep 9, 2008·7 cites·18 claims
- 0978US8519458B2Light-emitting element detection and classification deviceWANG BILY·Filed 2011·Granted Aug 27, 2013·4 cites·14 claims
- 1074US12204825B2Function safety and fault management modeling at electrical system level (ESL)TAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 21, 2025·0 cites·20 claims
- 1173US8710387B2LED package chip classification systemWANG BILY·Filed 2011·Granted Apr 29, 2014·3 cites·16 claims
- 1273US8663970B1Recombinant thermotolerant yeast with a substitute heat shock protein 104 promoterHUANG KUANG-TSE·Filed 2012·Granted Mar 4, 2014·5 cites·7 claims
- 1372US9858989B1Serialized SRAM access to reduce congestionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 2, 2018·2 cites·11 claims
- 1472US7395462B2Defect estimation apparatus and related methodMEDIATEK INC·Filed 2005·Granted Jul 1, 2008·2 cites·21 claims
- 1571US8686310B2Packaged chip detection and classification deviceWANG BILY·Filed 2011·Granted Apr 1, 2014·2 cites·11 claims
- 1669US11354465B2Function safety and fault management modeling at electrical system level (ESL)TAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 7, 2022·0 cites·20 claims
- 1768US11694732B2Active random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 4, 2023·0 cites·20 claims
- 1864US8873920B2Light-guiding cover structureWANG BILY·Filed 2012·Granted Oct 28, 2014·2 cites·14 claims
- 1962US11322185B2Active random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 3, 2022·0 cites·20 claims
- 2062US2024413286A1Display deviceINNOLUX CORP·Filed 2024·Application pending·0 cites
- 2158US7397396B2Modulation methods and systemsMEDIATEK INC·Filed 2006·Granted Jul 8, 2008·0 cites·12 claims
- 2254US10720206B2Serialized SRAM access to reduce congestionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 21, 2020·0 cites·20 claims
- 2353US9029725B2Packaged chip detection and classification deviceYOUNGTEK ELECTRONICS CORP·Filed 2013·Granted May 12, 2015·0 cites·8 claims
- 2453US6818917B2Voltage-switchable and-tunable and environment-insensitive multi-color superlattice infrared photodetectorUNIV NAT TAIWAN·Filed 2003·Granted Nov 16, 2004·6 cites·10 claims
- 2552US12490386B2Electronic deviceINNOLUX CORP·Filed 2022·Granted Dec 2, 2025·0 cites·18 claims
- 2651US10431296B2Serialized SRAM access to reduce congestionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Oct 1, 2019·0 cites·9 claims
- 2751US8107720B2Detection system for detecting appearances of many electronic elements and methods of using the sameWANG BILY·Filed 2009·Granted Jan 31, 2012·1 cites·18 claims
- 2849US9454273B2Touch panel with narrow borderHANNSTOUCH SOLUTION INCORPORATED·Filed 2014·Granted Sep 27, 2016·0 cites·14 claims
- 2947US2010166290A1Die defect inspecting system with a die defect inspecting function and a method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 3044US2009096462A1Wafer testing methodWANG BILY·Filed 2008·Application pending·0 cites
- 3143US10867642B2Active random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 15, 2020·0 cites·21 claims
- 3242US8559280B2Optical disk drive and method for data recording of optical disk drivesCHEN HSIN-CHENG·Filed 2009·Granted Oct 15, 2013·0 cites·10 claims
- 3340US2007133367A1Information recording device and related methodTSENG WEI-HSIANG·Filed 2005·Application pending·0 cites
- 3440US2007127343A1Information recording device and related methodTSENG WEI-HSIANG·Filed 2005·Application pending·0 cites
- 3539US2007239931A1System, apparatus, integrated circuit thereof, and method for recording data on optical storage mediumCHEN HSIN-CHENG·Filed 2006·Application pending·0 cites
- 3637US2007104053A1Method for controlling an optical disc drive to resume interrupted recording on an optical disc, circuit thereof, and optical disc drive capable of resuming interrupted recording on an optical discCHEN HSIN-CHENG·Filed 2005·Application pending·0 cites
- 3735US8525524B2Multi-track detection system for detecting the appearance of electronic elementsWANG BILY·Filed 2011·Granted Sep 3, 2013·0 cites·18 claims
- 3834US11489988B2Method for removing foreign substances from a camera system using vibration of piezoelectric component, and camera system comprising the piezoelectric componentH P B OPTOELECTRONICS CO LTD·Filed 2020·Granted Nov 1, 2022·0 cites·18 claims
- 3924US10729247B2Resettable pressure bar moduleNi pei yao·Filed 2018·Granted Aug 4, 2020·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →