Inventor · disambiguated record
Hsin-Li Cheng
Also filed as: CHENG HSIN-LI
32 granted patents·21 pending applications·191 citations·filing 2000–2025
96Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD47TAIWAN SEMICONDUCTOR MFG2WORLDWIDE SEMICONDUCTOR MFG2CHENG HSIN-LI1YANG JING-HWANG1
Top patents by PatentIndex Score
53 records- 0196US10276651B2Low warpage high density trench capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 30, 2019·15 cites·20 claims
- 0296US9178080B2Deep trench structure for high density capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Nov 3, 2015·49 cites·20 claims
- 0394US10971596B2Semiconductor device with reduced flicker noiseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 6, 2021·3 cites·20 claims
- 0493US11688789B2Semiconductor device with reduced flicker noiseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 27, 2023·2 cites·20 claims
- 0593US11675383B2Voltage reference circuit and method for providing reference voltageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 13, 2023·3 cites·20 claims
- 0693US11063157B1Trench capacitor profile to decrease substrate warpageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 13, 2021·6 cites·20 claims
- 0792US7642176B2Electrical fuse structure and methodTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Jan 5, 2010·25 cites·22 claims
- 0888US11769792B2Trench capacitor profile to decrease substrate warpageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 26, 2023·1 cites·20 claims
- 0988US10529818B1Semiconductor device with reduced flicker noiseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jan 7, 2020·3 cites·20 claims
- 1086US6281059B1Method of doing ESD protective device ion implant without additional photo maskWORLDWIDE SEMICONDUCTOR MFG·Filed 2000·Granted Aug 28, 2001·63 cites·14 claims
- 1184US2025063744A1Trench capacitor profile to decrease substrate warpageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1283US12191374B2Semiconductor device with reduced flicker noiseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 1383US12176387B2Trench capacitor profile to decrease substrate warpageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 24, 2024·0 cites·20 claims
- 1483US2025318230A1Semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1583US2025240981A1Low warpage high density trench capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1682US12272725B2Low warpage high density trench capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 1780US12422877B2Voltage reference circuit and method for providing reference voltageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 1880US2025359081A1Structure and Method for Deep Trench Capacitor with Reduced DeformationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1979US2025366218A1Semiconductor die package and methods of formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2076US2025351385A1Deep trench capacitor and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2176US2025318256A1Method of manufacturing semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2274US12363972B2Semiconductor structure and associated manufacturing methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 2374US2025113496A1Trench capacitor film scheme to reduce substrate warpageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2473US12072726B2Voltage reference circuit and method for providing reference voltageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 27, 2024·0 cites·20 claims
- 2572US11688762B2Low warpage high density trench capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 27, 2023·0 cites·20 claims
- 2672US9236326B2Semiconductor structure and fabricating method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jan 12, 2016·2 cites·20 claims
- 2772US2024178211A1Semiconductor device with capacitor and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2870US2024047552A1Structure and Method for Deep Trench Capacitor with Reduced DeformationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2970US2025254894A1Semiconductor die package and methods of formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 3069US12363996B2Semiconductor structure and method of manufacturing semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 3169US12317517B2Semiconductor die package and methods of formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 3269US11923352B2Semiconductor device with capacitor and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Mar 5, 2024·0 cites·20 claims
- 3368US12199139B2Trench capacitor film scheme to reduce substrate warpageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 14, 2025·0 cites·20 claims
- 3467US10693019B2Film scheme for a high density trench capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 23, 2020·1 cites·20 claims
- 3567US2024258302A1Semiconductor die package and methods of formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 3666US9601411B2Semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Mar 21, 2017·1 cites·20 claims
- 3762US10868110B2Low warpage high density trench capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 15, 2020·0 cites·20 claims
- 3860US2025240982A1Thin film resistor and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 3959US11489058B2Semiconductor structure and associated manufacturing methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 1, 2022·0 cites·20 claims
- 4059US9269758B2Low TCR high resistance resistorYANG JING-HWANG·Filed 2011·Granted Feb 23, 2016·2 cites·12 claims
- 4159US2025246536A1Trench capacitor structure and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 4259US2025351387A1Deep trench capacitor and methods of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 4358US6559018B1Silicon implant in a salicided cobalt layer to reduce cobalt-silicon agglomerationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted May 6, 2003·11 cites·25 claims
- 4458US2025006777A1Thin film resistorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 4557US10971404B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Apr 6, 2021·0 cites·20 claims
- 4656US2025063743A1In-trench capacitor merged structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 4755US2024321723A1Structure to mitigate vertical interconnect access induced metal corrosionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 4855US2024363529A1Thin film resistor with graded resistive layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 4953US9978645B2Semiconductor device and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 22, 2018·0 cites·20 claims
- 5052US2010090751A1Electrical Fuse Structure and MethodCHENG HSIN-LI·Filed 2009·Application pending·0 cites
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →