Inventor · disambiguated record
Hsuan-Chung Ko
Also filed as: KO HSUAN-CHUNG
4 granted patents·1 pending application·15 citations·filing 2008–2009
68Inventor score
Top patents by PatentIndex Score
5 records- 0180US8193819B2Method and apparatus for improving yield ratio of testingWANG WEI-PING·Filed 2009·Granted Jun 5, 2012·10 cites·20 claims
- 0259US7834775B2Automatic detecting device for radio frequency environmentKING JUAN ELECTRONICS CO LTD·Filed 2008·Granted Nov 16, 2010·4 cites·20 claims
- 0336US8085059B2RF chip test methodKO HSUAN-CHUNG·Filed 2009·Granted Dec 27, 2011·1 cites·13 claims
- 0433US7688093B2Sharing conversion board for testing chipsKING YUAN ELECTRONICS CO LTD·Filed 2008·Granted Mar 30, 2010·0 cites·10 claims
- 0526US2009184719A1Ic testing environment investigative device and methodKO HSUAN-CHUNG·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →