Inventor · disambiguated record
Hsi-Yu Kuo
Also filed as: KUO HSI-YU
17 granted patents·5 pending applications·26 citations·filing 2011–2025
89Inventor score
Top patents by PatentIndex Score
22 records- 0189US10157925B1IC structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 18, 2018·7 cites·20 claims
- 0286US9553508B1Protection circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 24, 2017·6 cites·20 claims
- 0383US2025324767A1Electrostatic discharge protection for integrated circuit during back end-of-line processingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0480US12369406B2Electrostatic discharge protection for integrated circuit during back end-of-line processingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 22, 2025·0 cites·20 claims
- 0580US9906224B1Semiconductor device to dispel charges and method forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Feb 27, 2018·3 cites·20 claims
- 0679US8525300B2Tunable ESD protection deviceKUO HSI-YU·Filed 2012·Granted Sep 3, 2013·7 cites·20 claims
- 0778US2025359150A1Semiconductor structures for monitoring plasma process-induced damagesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0875US2024387298A1Structure for detecting/monitoring process charging damage due to metal and isolation well chargingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0973US11764206B2Electrostatic discharge protection for integrated circuit during back end-of-line processingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 19, 2023·0 cites·20 claims
- 1072US2025133770A1Semiconductor structures for monitoring plasma process-induced damagesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1168US10510742B1Integrated circuit structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 17, 2019·1 cites·20 claims
- 1266US9343556B2Methods and apparatus for ESD protection circuitsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted May 17, 2016·2 cites·20 claims
- 1364US2022415717A1Structure for detecting/monitoring process charging damage due to metal and isolation well chargingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 1461US11450657B2Semiconductor device with improved electrostatic discharge or electro-over stress protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 20, 2022·0 cites·20 claims
- 1553US10685956B2Semiconductor device comprising deep counter well and manufacturing mehtod thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 16, 2020·0 cites·8 claims
- 1651US9979184B2Protection circuit for output deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 22, 2018·0 cites·20 claims
- 1746US9431356B2Semiconductor device and method of forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 30, 2016·0 cites·17 claims
- 1843US10283468B1Package structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 7, 2019·0 cites·20 claims
- 1943US9343555B2Methods and apparatus for ESD structuresTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted May 17, 2016·0 cites·20 claims
- 2043US9240401B2Semiconductor device and method of manufacturing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Jan 19, 2016·0 cites·20 claims
- 2142US10157907B2Semiconductor device and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Dec 18, 2018·0 cites·20 claims
- 2235US8598625B2ESD protection device with tunable design windowsKUO HSI-YU·Filed 2011·Granted Dec 3, 2013·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →