Inventor · disambiguated record
Hsueh-Heng Liu
Also filed as: LIU HSUEH-HENG
2 granted patents·1 pending application·34 citations·filing 1999–2002
63Inventor score
Files withTAIWAN SEMICONDUCTOR MFG3
Top patents by PatentIndex Score
3 records- 0162US6773967B1Method to prevent antifuse Si damage using sidewall spacersTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Aug 10, 2004·16 cites·23 claims
- 0252US6486067B1Method for improving the electrical isolation between the contact and gate in a self-aligned contact MOSFET device structureTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 26, 2002·18 cites·14 claims
- 0337US2003049918A1Method for improving the electrical isolation between the contact and gate in a self-aligned contact mosfet device structureTAIWAN SEMICONDUCTOR MFG·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →