Inventor · disambiguated record
Hsiang-Chun Wei
Also filed as: WEI HSIANG-CHUN
7 granted patents·1 pending application·6 citations·filing 2012–2024
72Inventor score
Top patents by PatentIndex Score
8 records- 0188US11507020B2Optical measurement system for obtaining and analyzing surface topography of objectIND TECH RES INST·Filed 2020·Granted Nov 22, 2022·2 cites·18 claims
- 0279US9752866B2Measurement systemIND TECH RES INST·Filed 2015·Granted Sep 5, 2017·4 cites·14 claims
- 0367US12270638B2Measurement system and measurement methodIND TECH RES INST·Filed 2022·Granted Apr 8, 2025·0 cites·12 claims
- 0463US2025198915A1Spectral feature measurement methodIND TECH RES INST·Filed 2024·Application pending·0 cites
- 0561US12007221B2Heterogeneous integration detecting method and heterogeneous integration detecting apparatusIND TECH RES INST·Filed 2021·Granted Jun 11, 2024·0 cites·10 claims
- 0658US12099053B2Method of training AI for label-free cell viability determination and label-free cell viability determination method by trained AIIND TECH RES INST·Filed 2021·Granted Sep 24, 2024·0 cites·9 claims
- 0748US11656181B2Inspection apparatus and inspection method for inspecting light-emitting diodesIND TECH RES INST·Filed 2020·Granted May 23, 2023·0 cites·24 claims
- 0844US9030746B2Fabrication method of microlens array and microlens array thereofUNIV NAT TAIWAN·Filed 2012·Granted May 12, 2015·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →