Inventor · disambiguated record
Hsuan-Hao Yang
Also filed as: YANG HSUAN · YANG HSUAN-HAO
1 granted patent·2 pending applications·0 citations·filing 2007–2012
10Inventor score
Top patents by PatentIndex Score
3 records- 0139US2010142796A1Inspection method and apparatus for substrateCHANG JEN-MING·Filed 2008·Application pending·0 cites
- 0236US2008300809A1Defect inspecting method and device thereofDELTA ELECTRONICS INC·Filed 2007·Application pending·0 cites
- 0332US9341647B2Testing apparatus and methodLIN CHUN-HSUN·Filed 2012·Granted May 17, 2016·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Hsuan-Hao Yang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →