Inventor · disambiguated record
Hui-An Chang
Also filed as: CHANG HUI Y · CHANG HUI-AN
1 granted patent·2 pending applications·6 citations·filing 1999–2008
28Inventor score
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3 records- 0139US2009212794A1Test key for semiconductor structurePROMOS TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 0230US2006132152A1Contact-type film probeWANG CHIH Y·Filed 2004·Application pending·0 cites
- 0328US6346418B1Method for evaluation of metal impurity in lithographic materialsMOSEL VITELIC INC·Filed 1999·Granted Feb 12, 2002·6 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →