Inventor · disambiguated record
Huey-Chi Chu
Also filed as: CHU HUEY-CHI
13 granted patents·324 citations·filing 1999–2015
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD5TAIWAN SEMICONDUCTOR MFG3VANGUARD INT SEMICONDUCT CORP3CHEN KUO-JI1TU KUO-CHI1
Top patents by PatentIndex Score
13 records- 0197US6720232B1Method of fabricating an embedded DRAM for metal-insulator-metal (MIM) capacitor structureTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Apr 13, 2004·181 cites·33 claims
- 0295US9391016B2MIM capacitor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jul 12, 2016·30 cites·20 claims
- 0390US9368392B2MIM capacitor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jun 14, 2016·13 cites·19 claims
- 0490US8436408B2Semiconductor device with decoupling capacitor designTU KUO-CHI·Filed 2008·Granted May 7, 2013·19 cites·26 claims
- 0589US9219110B2MIM capacitor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Dec 22, 2015·12 cites·20 claims
- 0684US9728597B2Metal-insulator-metal structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 8, 2017·4 cites·20 claims
- 0784US9178008B2Metal-insulator-metal capacitor with current leakage protectionCHEN KUO-JI·Filed 2012·Granted Nov 3, 2015·6 cites·20 claims
- 0878US6833578B1Method and structure improving isolation between memory cell passing gate and capacitorTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Dec 21, 2004·23 cites·21 claims
- 0977US7115935B2Embedded DRAM for metal-insulator-metal (MIM) capacitor structureTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 3, 2006·19 cites·20 claims
- 1053US9425247B2Metal-insulator-metal capacitor with current leakage protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 23, 2016·0 cites·20 claims
- 1139US6309968B1Method to improve intrinsic refresh time and dichlorosilane formed gate oxide reliabilityVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Oct 30, 2001·8 cites·6 claims
- 1236US6207491B1Method for preventing silicon substrate loss in fabricating semiconductor deviceVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Mar 27, 2001·5 cites·18 claims
- 1331US6294435B1Method of reducing word line resistance and contact resistanceVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Sep 25, 2001·4 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →