Inventor · disambiguated record
Hung-Wei Lai
Also filed as: LAI HUNG-WEI
4 granted patents·1 pending application·9 citations·filing 2013–2017
66Inventor score
Files withSITRONIX TECHNOLOGY CORP2HERMES TESTING SOLUTIONS INC1SYNC TECH SYSTEM CORP1UNIVERSAL SCIENT INDUSTRIAL SHANGHAI CO LTD1
Top patents by PatentIndex Score
5 records- 0176US9945900B1Testing device for radio frequency front end and radio frequency front end testing methodUNIVERSAL SCIENT INDUSTRIAL SHANGHAI CO LTD·Filed 2017·Granted Apr 17, 2018·4 cites·10 claims
- 0272US9435863B2Integrated circuit testing interface on automatic test equipmentSITRONIX TECHNOLOGY CORP·Filed 2014·Granted Sep 6, 2016·3 cites·16 claims
- 0363US9506974B2Active probe cardSITRONIX TECHNOLOGY CORP·Filed 2014·Granted Nov 29, 2016·2 cites·6 claims
- 0436US2014125371A1Stand alone multi-cell probe card for at-speed functional testingHERMES TESTING SOLUTIONS INC·Filed 2013·Application pending·0 cites
- 0526US9952277B2Test device and method using single probe to test multiple pads of chipSYNC TECH SYSTEM CORP·Filed 2016·Granted Apr 24, 2018·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →