Inventor · disambiguated record
Humphrey J. Maris
Also filed as: MARIS HUMPHREY J · MARIS HUMPHREY JOHN
34 granted patents·2 pending applications·2,158 citations·filing 1985–2015
98Inventor score
Files withUNIV BROWN RES FOUND22UNIV BROWN7MARIS HUMPHREY J4BW BROWN UNIVERSITY RESEARCH F1COLGAN MICHAEL1
Top patents by PatentIndex Score
36 records- 0198US5748318AOptical stress generator and detectorUNIV BROWN RES FOUND·Filed 1996·Granted May 5, 1998·321 cites·22 claims
- 0296US7624640B2Opto-acoustic methods and apparatus for performing high resolution acoustic imaging and other sample probing and modification operationsUNIV BROWN·Filed 2006·Granted Dec 1, 2009·44 cites·47 claims
- 0395US6208421B1Optical stress generator and detectorUNIV BROWN RES FOUND·Filed 2000·Granted Mar 27, 2001·61 cites·7 claims
- 0495US5959735AOptical stress generator and detectorUNIV BROWN RES FOUND·Filed 1997·Granted Sep 28, 1999·163 cites·45 claims
- 0594US6208418B1Apparatus and method for measurement of the mechanical properties and electromigration of thin filmsUNIV BROWN RES FOUND·Filed 2000·Granted Mar 27, 2001·60 cites·19 claims
- 0694US6191855B1Apparatus and method for the determination of grain size in thin filmsUNIV BROWN RES FOUND·Filed 2000·Granted Feb 20, 2001·62 cites·8 claims
- 0793US6271921B1Optical stress generator and detectorUNIV BROWN RES FOUND·Filed 2000·Granted Aug 7, 2001·41 cites·8 claims
- 0893US5748317AApparatus and method for characterizing thin film and interfaces using an optical heat generator and detectorUNIV BROWN RES FOUND·Filed 1997·Granted May 5, 1998·137 cites·19 claims
- 0993US5706094AUltrafast optical technique for the characterization of altered materialsUNIV BROWN RES FOUND·Filed 1995·Granted Jan 6, 1998·133 cites·71 claims
- 1092US6211961B1Optical method for the characterization of the electrical properties of semiconductors and insulating filmsUNIV BROWN RES FOUND·Filed 1999·Granted Apr 3, 2001·103 cites·15 claims
- 1191US8302480B2Enhanced ultra-high resolution acoustic microscopeMARIS HUMPHREY J·Filed 2008·Granted Nov 6, 2012·20 cites·60 claims
- 1291US6321601B1Optical method for the characterization of laterally-patterned samples in integrated circuitsUNIV BROWN RES FOUND·Filed 1999·Granted Nov 27, 2001·71 cites·30 claims
- 1391US5844684AOptical method for determining the mechanical properties of a materialUNIV BROWN RES FOUND·Filed 1997·Granted Dec 1, 1998·107 cites·55 claims
- 1490US6400449B2Optical stress generator and detectorUNIV BROWN RES FOUND·Filed 2001·Granted Jun 4, 2002·64 cites·12 claims
- 1590US4710030AOptical generator and detector of stress pulsesBW BROWN UNIVERSITY RESEARCH F·Filed 1985·Granted Dec 1, 1987·261 cites·37 claims
- 1689US6175416B1Optical stress generator and detectorUNIV BROWN RES FOUND·Filed 1999·Granted Jan 16, 2001·83 cites·26 claims
- 1787US6025918AApparatus and method for measurement of the mechanical properties and electromigration of thin filmsUNIV BROWN RES FOUND·Filed 1998·Granted Feb 15, 2000·69 cites·27 claims
- 1887US6008906AOptical method for the characterization of the electrical properties of semiconductors and insulating filmsUNIV BROWN RES FOUND·Filed 1997·Granted Dec 28, 1999·100 cites·29 claims
- 1986US7782471B2Optical method for the characterization of laterally-patterned samples in integrated circuitsUNIV BROWN·Filed 2009·Granted Aug 24, 2010·6 cites·23 claims
- 2086US6381019B1Ultrasonic generator and detector using an optical mask having a grating for launching a plurality of spatially distributed, time varying strain pulses in a sampleUNIV BROWN RES FOUND·Filed 2000·Granted Apr 30, 2002·24 cites·52 claims
- 2186US5864393AOptical method for the determination of stress in thin filmsUNIV BROWN RES FOUND·Filed 1997·Granted Jan 26, 1999·61 cites·29 claims
- 2284US7339676B2Optical method and system for the characterization of laterally-patterned samples in integrated circuitsUNIV BROWN·Filed 2001·Granted Mar 4, 2008·16 cites·28 claims
- 2384US6038026AApparatus and method for the determination of grain size in thin filmsUNIV BROWN RES FOUND·Filed 1998·Granted Mar 14, 2000·57 cites·24 claims
- 2483US7505154B2Optical method for the characterization of laterally patterned samples in integrated circuitsUNIV BROWN·Filed 2008·Granted Mar 17, 2009·5 cites·20 claims
- 2580US9041931B2Substrate analysis using surface acoustic wave metrologyCOLGAN MICHAEL·Filed 2010·Granted May 26, 2015·7 cites·30 claims
- 2678US6563591B2Optical method for the determination of grain orientation in filmsUNIV BROWN RES FOUND·Filed 2001·Granted May 13, 2003·18 cites·18 claims
- 2775US8537363B2Picosecond ultrasonic system incorporating an optical cavityMARIS HUMPHREY J·Filed 2007·Granted Sep 17, 2013·4 cites·25 claims
- 2875US6512586B2Ultrasonic generator and detector using an optical mask having a grating for launching a plurality of spatially distributed, time varying strain pulses in a sampleUNIV BROWN RES FOUND·Filed 2001·Granted Jan 28, 2003·10 cites·21 claims
- 2969US6317216B1Optical method for the determination of grain orientation in filmsUNIV BROWN RES FOUND·Filed 1999·Granted Nov 13, 2001·30 cites·18 claims
- 3068US8567253B2Opto-acoustic methods and apparatus for performing high resolution acoustic imaging and other sample probing and modification operationsMARIS HUMPHREY J·Filed 2006·Granted Oct 29, 2013·5 cites·87 claims
- 3167US7894070B2Optical method and system for the characterization of laterally-patterned samples in integrated circuitsUNIV BROWN·Filed 2010·Granted Feb 22, 2011·1 cites·20 claims
- 3252US2006272418A1Opto-acoustic methods and apparatus for perfoming high resolution acoustic imaging and other sample probing and modification operationsUNIV BROWN·Filed 2005·Application pending·0 cites
- 3349US6087242AMethod to improve commercial bonded SOI materialIBM·Filed 1998·Granted Jul 11, 2000·14 cites·31 claims
- 3447US9329224B2Optical testing of a multi quantum well semiconductor deviceMARIS HUMPHREY J·Filed 2012·Granted May 3, 2016·0 cites·22 claims
- 3539US10113861B2Optical system and methods for the determination of stress in a substrateUNIV BROWN·Filed 2015·Granted Oct 30, 2018·0 cites·35 claims
- 3634US2002066936A1Electronic and optoelectronic devices using fractional carriersUNIV BROWN RES FOUND·Filed 2001·Application pending·0 cites
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