Inventor · disambiguated record
Hugh P. Mcadams
Also filed as: MCADAMS HUGH · MCADAMS HUGH P · MCADAMS HUGH PRYOR · MCADAMS JR HUGH P
88 granted patents·2 pending applications·1,708 citations·filing 1974–2017
99Inventor score
Files withTEXAS INSTRUMENTS INC65AGILENT TECHNOLOGIES INC9CLINTON MICHAEL PATRICK4LITTON SYSTEMS INC4SUMMERFELT SCOTT R4
Top patents by PatentIndex Score
90 records- 0197US8717800B2Method and apparatus pertaining to a ferroelectric random access memoryCLINTON MICHAEL PATRICK·Filed 2011·Granted May 6, 2014·59 cites·6 claims
- 0297US8508974B2Ferroelectric memory with shunt deviceCLINTON MICHAEL PATRICK·Filed 2011·Granted Aug 13, 2013·60 cites·13 claims
- 0397US8441833B2Differential plate line screen test for ferroelectric latch circuitsSUMMERFELT SCOTT R·Filed 2012·Granted May 14, 2013·30 cites·9 claims
- 0496US4081701AHigh speed sense amplifier for MOS random access memoryTEXAS INSTRUMENTS INC·Filed 1976·Granted Mar 28, 1978·69 cites·11 claims
- 0592US4716320ACMOS sense amplifier with isolated sensing nodesTEXAS INSTRUMENTS INC·Filed 1986·Granted Dec 29, 1987·54 cites·16 claims
- 0690US9117535B2Single sided bit line restore for power reductionTEXAS INSTRUMENTS INC·Filed 2013·Granted Aug 25, 2015·12 cites·20 claims
- 0790US8472236B2Differential plate line screen test for ferroelectric latch circuitsTEXAS INSTRUMENTS INC·Filed 2012·Granted Jun 25, 2013·10 cites·10 claims
- 0889US5953278AData sequencing and registering in a four bit pre-fetch SDRAMTEXAS INSTRUMENTS INC·Filed 1997·Granted Sep 14, 1999·89 cites·7 claims
- 0987US8477522B2Ferroelectric memory write-backCLINTON MICHAEL PATRICK·Filed 2011·Granted Jul 2, 2013·12 cites·13 claims
- 1087US5274828AComputer including an integrated circuit having an on-chip high voltage sourceTEXAS INSTRUMENTS INC·Filed 1992·Granted Dec 28, 1993·60 cites·12 claims
- 1186US8811057B1Power reduction circuit and methodTEXAS INSTRUMENTS INC·Filed 2013·Granted Aug 19, 2014·9 cites·20 claims
- 1286US6204701B1Power up detection circuitTEXAS INSTRUMENTS INC·Filed 1994·Granted Mar 20, 2001·45 cites·10 claims
- 1386US5297086AMethod for initializing redundant circuitryTEXAS INSTRUMENTS INC·Filed 1992·Granted Mar 22, 1994·61 cites·5 claims
- 1485US5034623ALow power, TTL level CMOS input buffer with hysteresisTEXAS INSTRUMENTS INC·Filed 1989·Granted Jul 23, 1991·33 cites·28 claims
- 1584US4638182AHigh-level CMOS driver circuitTEXAS INSTRUMENTS INC·Filed 1984·Granted Jan 20, 1987·27 cites·26 claims
- 1683US7133304B2Method and apparatus to reduce storage node disturbance in ferroelectric memoryTEXAS INSTRUMENTS INC·Filed 2004·Granted Nov 7, 2006·32 cites·25 claims
- 1783US6704218B2FeRAM with a single access/multiple-comparison operationAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 9, 2004·33 cites·16 claims
- 1883US5117426ACircuit, device, and method to detect voltage leakageTEXAS INSTRUMENTS INC·Filed 1990·Granted May 26, 1992·52 cites·11 claims
- 1982US7630257B2Methods and systems for accessing memoryTEXAS INSTRUMENTS INC·Filed 2006·Granted Dec 8, 2009·13 cites·8 claims
- 2081US8416598B2Differential plate line screen test for ferroelectric latch circuitsSUMMERFELT SCOTT R·Filed 2010·Granted Apr 9, 2013·6 cites·4 claims
- 2181US5029136AHigh-speed DRAM sense amp with high noise immunityTEXAS INSTRUMENTS INC·Filed 1989·Granted Jul 2, 1991·37 cites·7 claims
- 2279US6031411ALow power substrate bias circuitTEXAS INSTRUMENTS INC·Filed 1994·Granted Feb 29, 2000·38 cites·17 claims
- 2379US5208776APulse generation circuitTEXAS INSTRUMENTS INC·Filed 1990·Granted May 4, 1993·42 cites·8 claims
- 2478US8058677B2Stress buffer layer for ferroelectric random access memorySUMMERFELT SCOTT R·Filed 2009·Granted Nov 15, 2011·6 cites·9 claims
- 2578US6952623B2Permanent chip ID using FeRAMAGILENT TECHNOLOGIES INC·Filed 2002·Granted Oct 4, 2005·21 cites·8 claims
- 2678US5841688AMatched delay word line strapTEXAS INSTRUMENTS INC·Filed 1997·Granted Nov 24, 1998·42 cites·21 claims
- 2777US10631248B2Mid-cycle adjustment of internal clock signal timingTEXAS INSTRUMENTS INC·Filed 2017·Granted Apr 21, 2020·2 cites·25 claims
- 2875US6809954B1Circuit and method for reducing access transistor gate oxide stressTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 26, 2004·22 cites·28 claims
- 2975US5309446ATest validation method for a semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1992·Granted May 3, 1994·40 cites·7 claims
- 3075US5303180APin programmable dram that allows customer to program option desiredTEXAS INSTRUMENTS INC·Filed 1991·Granted Apr 12, 1994·35 cites·12 claims
- 3175US5270975AMemory device having a non-uniform redundancy decoder arrangementTEXAS INSTRUMENTS INC·Filed 1992·Granted Dec 14, 1993·35 cites·8 claims
- 3275US4561702ACMOS Address buffer circuitTEXAS INSTRUMENTS INC·Filed 1984·Granted Dec 31, 1985·19 cites·7 claims
- 3374US6819601B2Programmable reference for 1T/1C ferroelectric memoriesTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 16, 2004·22 cites·17 claims
- 3474US6667896B2Grouped plate line drive architecture and methodAGILENT TECHNOLOGIES INC·Filed 2002·Granted Dec 23, 2003·22 cites·24 claims
- 3573US6804141B1Dynamic reference voltage calibration integrated FeRAMSAGILENT TECHNOLOGIES INC·Filed 2003·Granted Oct 12, 2004·25 cites·14 claims
- 3673US5353250APin programmable dram that provides customer option programmabilityTEXAS INSTRUMENTS INC·Filed 1993·Granted Oct 4, 1994·32 cites·4 claims
- 3773US5301160AComputer including an integrated circuit having a low power selection control arrangementTEXAS INSTRUMENTS INC·Filed 1992·Granted Apr 5, 1994·34 cites·13 claims
- 3873US4293932ARefresh operations for semiconductor memoryTEXAS INSTRUMENTS INC·Filed 1980·Granted Oct 6, 1981·21 cites·9 claims
- 3972US6785629B2Accuracy determination in bit line voltage measurementsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Aug 31, 2004·20 cites·8 claims
- 4072US4621346ALow power CMOS fuse circuitTEXAS INSTRUMENTS INC·Filed 1984·Granted Nov 4, 1986·19 cites·9 claims
- 4171US5347173ADynamic memory, a power up detection circuit, and a level detection circuitTEXAS INSTRUMENTS INC·Filed 1992·Granted Sep 13, 1994·20 cites·5 claims
- 4270US8071430B2Stress buffer layer for ferroelectric random access memorySUMMERFELT SCOTT R·Filed 2011·Granted Dec 6, 2011·2 cites·10 claims
- 4370US7933138B2F-RAM device with current mirror sense ampTEXAS INSTRUMENTS INC·Filed 2009·Granted Apr 26, 2011·5 cites·10 claims
- 4470US6714469B2On-chip compression of charge distribution dataAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 30, 2004·18 cites·19 claims
- 4570US6590799B1On-chip charge distribution measurement circuitAGILENT TECHNOLOGIES INC·Filed 2002·Granted Jul 8, 2003·18 cites·20 claims
- 4669US6970371B1Reference generator system and methods for reading ferroelectric memory cells using reduced bitline voltagesTEXAS INSTRUMENTS INC·Filed 2004·Granted Nov 29, 2005·16 cites·34 claims
- 4767US5802005AFour bit pre-fetch sDRAM column select architectureTEXAS INSTRUMENTS INC·Filed 1996·Granted Sep 1, 1998·28 cites·8 claims
- 4866US5191555ACmos single input buffer for multiplexed inputsTEXAS INSTRUMENTS INC·Filed 1990·Granted Mar 2, 1993·29 cites·6 claims
- 4966US4375727ACant angle sensor assemblyLITTON SYSTEMS INC·Filed 1980·Granted Mar 8, 1983·17 cites·3 claims
- 5064US6735106B2Accelerated fatigue testingAGILENT TECHNOLOGIES INC·Filed 2002·Granted May 11, 2004·14 cites·19 claims
Showing the top 50 of 90 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →