Inventor · disambiguated record
Hua Yang
Also filed as: YANG HUA · YANG HUA-YU
15 granted patents·1 pending application·195 citations·filing 1999–2024
93Inventor score
Top patents by PatentIndex Score
16 records- 0195US11953728B2Method for III-v/silicon hybrid integrationROCKLEY PHOTONICS LTD·Filed 2022·Granted Apr 9, 2024·5 cites·20 claims
- 0294US11378762B2Method for III-V/silicon hybrid integrationROCKLEY PHOTONICS LTD·Filed 2021·Granted Jul 5, 2022·4 cites·25 claims
- 0386US6514785B1CMOS image sensor n-type pin-diode structureTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Feb 4, 2003·44 cites·32 claims
- 0478US6531725B2Pinned photodiode structure in a 3T active pixel sensorTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 11, 2003·22 cites·6 claims
- 0576US12461308B2Method for III-V/silicon hybrid integrationROCKLEY PHOTONICS LTD·Filed 2024·Granted Nov 4, 2025·0 cites·17 claims
- 0673US6372537B1Pinned photodiode structure in a 3T active pixel sensorTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Apr 16, 2002·17 cites·14 claims
- 0773US2022334329A1Method for iii-v/silicon hybrid integrationROCKLEY PHOTONICS LTD·Filed 2022·Application pending·0 cites
- 0871US6534356B1Method of reducing dark current for an image sensor device via use of a polysilicon padTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 18, 2003·17 cites·24 claims
- 0970US6071826AMethod of manufacturing CMOS image sensor leakage free with double layer spacerTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jun 6, 2000·38 cites·37 claims
- 1069US6627475B1Buried photodiode structure for CMOS image sensorTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Sep 30, 2003·15 cites·34 claims
- 1165US7616089B2Compensation of field effect on polycrystalline resistorsCIRRUS LOGIC INC·Filed 2007·Granted Nov 10, 2009·4 cites·9 claims
- 1262US12233639B2Source wafer, method, and optoelectronic devicesROCKLEY PHOTONICS LTD·Filed 2022·Granted Feb 25, 2025·0 cites·17 claims
- 1356US6306678B1Process for fabricating a high quality CMOS image sensorTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Oct 23, 2001·21 cites·17 claims
- 1455US12360151B2Method of testing, wafer, and testing stationROCKLEY PHOTONICS LTD·Filed 2021·Granted Jul 15, 2025·0 cites·18 claims
- 1543US7915995B2Compensation of field effect on polycrystalline resistorsCIRRUS LOGIC INC·Filed 2009·Granted Mar 29, 2011·0 cites·19 claims
- 1640US6147372ALayout of an image sensor for increasing photon induced currentTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 14, 2000·8 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →