Inventor · disambiguated record
Huiyan Zhou
Also filed as: ZHOU HUIYAN
2 granted patents·1 pending application·0 citations·filing 2025–2025
21Inventor score
Files withBEIJING TSD SEMICONDUCTOR CO LTD3
Top patents by PatentIndex Score
3 records- 0142US12397394B1Method and device for determining parameters of near-surface dielectric layer in wafer grinding sceneBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Granted Aug 26, 2025·0 cites·11 claims
- 0238US2025369748A1Method for measuring film thickness in situ, reference spectrum generation method, and devicesBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Application pending·0 cites
- 0332US12416490B1Method and chemical mechanical planarization device for in-situ measurement of film thicknessBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Granted Sep 16, 2025·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →