Inventor · disambiguated record
Hyung-Suk Cho
Also filed as: CHO HYUNG-SUK
23 granted patents·3 pending applications·153 citations·filing 1999–2023
93Inventor score
Files withLG CHEMICAL LTD10SAMSUNG ELECTRONICS CO LTD7LG ENERGY SOLUTION LTD4KIM MINSUNG1KIM YOUNG SEOK1
Top patents by PatentIndex Score
26 records- 0190US6440760B1Method of measuring etched state of semiconductor wafer using optical impedence measurementSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 27, 2002·67 cites·67 claims
- 0289US11456450B2Method and apparatus for evaluating phase stability of electrode mixture slurryLG CHEMICAL LTD·Filed 2019·Granted Sep 27, 2022·4 cites·10 claims
- 0382US11542164B2Carbon nanotube dispersion and method for preparing the sameLG CHEMICAL LTD·Filed 2019·Granted Jan 3, 2023·2 cites·10 claims
- 0482US6528333B1Method of and device for detecting micro-scratchesSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Mar 4, 2003·28 cites·18 claims
- 0581US11845655B2Carbon nanotube dispersion and method for preparing the sameLG CHEMICAL LTD·Filed 2022·Granted Dec 19, 2023·0 cites·10 claims
- 0680US10516154B2Positive electrode for lithium secondary battery and method for preparing the sameLG CHEMICAL LTD·Filed 2017·Granted Dec 24, 2019·1 cites·11 claims
- 0779US8034640B2Apparatus and method to inspect defect of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Oct 11, 2011·5 cites·19 claims
- 0876US6449037B2Method of and device for detecting micro-scratchesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Sep 10, 2002·19 cites·4 claims
- 0971US6462141B1Diene copolymer substituted by alkoxy silane, and organic and inorganic hybrid composition comprising the sameKOREA RES INST CHEM TECH·Filed 1999·Granted Oct 8, 2002·25 cites·9 claims
- 1069US9727799B2Method of automatic defect classificationSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 8, 2017·2 cites·20 claims
- 1167US12508600B2Horizontal bead mill for dispersing secondary battery material, and conductive material dispersion methodLG ENERGY SOLUTION LTD·Filed 2021·Granted Dec 30, 2025·0 cites·12 claims
- 1265US2025188253A1Method for preparing polymer solution for electrode slurryLG ENERGY SOLUTION LTD·Filed 2023·Application pending·0 cites
- 1364US11984601B2Conductive material dispersion liquid, electrode and lithium secondary battery prepared by using the sameLG ENERGY SOLUTION LTD·Filed 2019·Granted May 14, 2024·0 cites·13 claims
- 1462US10535862B2System for manufacturing electrode for secondary battery having scratch testerLG CHEMICAL LTD·Filed 2017·Granted Jan 14, 2020·0 cites·9 claims
- 1562US2023369597A1Electrode including active material layer in bilayer structure, manufacturing method therefore and secondary battery oomprising sameLG ENERGY SOLUTION LTD·Filed 2021·Application pending·0 cites
- 1655US10888870B2Grinder using induced electric fieldLG CHEMICAL LTD·Filed 2017·Granted Jan 12, 2021·0 cites·3 claims
- 1754US10516160B2Electrode for lithium secondary battery and lithium secondary battery including the sameLG CHEMICAL LTD·Filed 2017·Granted Dec 24, 2019·0 cites·11 claims
- 1853US10644316B2Anode slurry for secondary battery for improving dispersibility and reducing resistance, and anode comprising sameLG CHEMICAL LTD·Filed 2016·Granted May 5, 2020·0 cites·6 claims
- 1951US11735735B2Method for predicting processability of electrode slurry and selecting electrode binderLG CHEMICAL LTD·Filed 2018·Granted Aug 22, 2023·0 cites·8 claims
- 2048US10651497B2Apparatus and method for preparing slurry for secondary batteryLG CHEMICAL LTD·Filed 2017·Granted May 12, 2020·0 cites·1 claims
- 2145US11144178B2Method for providing contents for mobile terminal on the basis of user touch and hold timeKIM MINSUNG·Filed 2018·Granted Oct 12, 2021·0 cites·6 claims
- 2245US8546154B2Apparatus and method to inspect defect of semiconductor deviceSHIN JI-YOUNG·Filed 2011·Granted Oct 1, 2013·0 cites·9 claims
- 2343US9194816B2Method of detecting a defect of a substrate and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Nov 24, 2015·0 cites·7 claims
- 2436US8324571B2Apparatus and method for measuring semiconductor deviceKIM YOUNG-SEOK·Filed 2010·Granted Dec 4, 2012·0 cites·18 claims
- 2535US9831137B2Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 28, 2017·0 cites·20 claims
- 2634US2007025609A1Method of detecting defect of a pattern in a semiconductor deviceRYU SUNG-GON·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →