Inventor · disambiguated record
Hyun-Guen Iy
Also filed as: IY HYUN-GUEN
1 granted patent·3 pending applications·0 citations·filing 2006–2015
8Inventor score
Top patents by PatentIndex Score
4 records- 0136US2006187647A1Test kit semiconductor package and method of testing semiconductor package using the sameIY HYUN-GUEN·Filed 2006·Application pending·0 cites
- 0232US9625522B2Adaptor structure and apparatus for testing a semiconductor package including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Apr 18, 2017·0 cites·20 claims
- 0327US2008186046A1Test socket for testing semiconductor chip, test apparatus including the test socket and method for testing semiconductor chipSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0413US2012169366A1Socket contact for testing a semiconductorIY HYUN-GUEN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →