Inventor · disambiguated record
Hyun-Soon Jang
Also filed as: JANG HYUN-SOON
38 granted patents·2 pending applications·1,389 citations·filing 1990–2012
98Inventor score
Top patents by PatentIndex Score
40 records- 0197US6590822B2System and method for performing partial array self-refresh operation in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jul 8, 2003·136 cites·9 claims
- 0296US6819617B2System and method for performing partial array self-refresh operation in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 16, 2004·96 cites·4 claims
- 0394US6560158B2Power down voltage control method and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 6, 2003·101 cites·30 claims
- 0494US5631871ASystem for selecting one of a plurality of memory banks for use in an active cycle and all other banks for an inactive precharge cycleSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted May 20, 1997·84 cites·1 claims
- 0594US5590086ASemiconductor memory having a plurality of I/O busesSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 31, 1996·92 cites·1 claims
- 0693US5835956ASynchronous dram having a plurality of latency modesSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 10, 1998·76 cites·33 claims
- 0792US5838990ACircuit in a semiconductor memory for programming operation modes of the memorySAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 17, 1998·63 cites·47 claims
- 0892US5568445ASynchronous semiconductor memory device with a write latency control functionSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Oct 22, 1996·101 cites·17 claims
- 0991US6058063AIntegrated circuit memory devices having reduced power consumption requirements during standby mode operationSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted May 2, 2000·93 cites·10 claims
- 1088US5703828ASemiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 30, 1997·52 cites·14 claims
- 1187US6992943B2System and method for performing partial array self-refresh operation in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jan 31, 2006·32 cites·10 claims
- 1287US6510096B2Power down voltage control method and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jan 21, 2003·44 cites·28 claims
- 1386US7746712B2Semiconductor memory device including post package repair control circuit and post package repair methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jun 29, 2010·24 cites·24 claims
- 1486US6343036B1Multi-bank dynamic random access memory devices having all bank precharge capabilitySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 29, 2002·41 cites·15 claims
- 1585US6326815B1Sense amplifier of semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 4, 2001·32 cites·32 claims
- 1684US5355033AData input buffer circuit for use in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1991·Granted Oct 11, 1994·41 cites·29 claims
- 1778US7566958B2Multi-chip package for reducing parasitic load of pinSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 28, 2009·6 cites·11 claims
- 1878US5337277ARow redundancy circuit for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1992·Granted Aug 9, 1994·40 cites·13 claims
- 1977US5999021APad signal detecting circuit in a semiconductor device for detecting a reference voltage in a high-speed interfaceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Dec 7, 1999·31 cites·32 claims
- 2075US7941714B2Parallel bit test apparatus and parallel bit test method capable of reducing test timeSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted May 10, 2011·11 cites·20 claims
- 2173US7148563B2Multi-chip package for reducing parasitic load of pinSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Dec 12, 2006·14 cites·4 claims
- 2273US5535171AData output buffer of a semiconducter memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Jul 9, 1996·28 cites·16 claims
- 2369US5485426ASemiconductor memory device having a structure for driving input/output lines at a high speedSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Jan 16, 1996·27 cites·9 claims
- 2468US6476646B2Sense amplifier of semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 5, 2002·13 cites·20 claims
- 2567US5646899ABit line sensing circuit of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Jul 8, 1997·27 cites·17 claims
- 2662US6980036B2Semiconductor device comprising frequency multiplier of external clock and output buffer of test data and semiconductor test methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Dec 27, 2005·10 cites·13 claims
- 2760US6281745B1Internal power supply voltage generating circuit of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 28, 2001·11 cites·5 claims
- 2855US7868438B2Multi-chip package for reducing parasitic load of pinSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jan 11, 2011·0 cites·9 claims
- 2955US6751132B2Semiconductor memory device and voltage generating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 15, 2004·8 cites·18 claims
- 3055US5771200ASemiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 23, 1998·17 cites·3 claims
- 3154US8786303B2Semiconductor device having a plurality of padsKIM KAB YONG·Filed 2010·Granted Jul 22, 2014·1 cites·13 claims
- 3253US5812475AProgrammable refresh circuits and methods for integrated circuit memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 22, 1998·14 cites·20 claims
- 3352US7262479B2Layout structure of fuse bank of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 28, 2007·5 cites·11 claims
- 3451US7657713B2Memory using packet controller and memorySAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Feb 2, 2010·7 cites·30 claims
- 3547US8902673B2Method of testing a semiconductor memory deviceKIM HONG-BEOM·Filed 2012·Granted Dec 2, 2014·1 cites·20 claims
- 3642US5196913AInput protection device for improving of delay time on input stage in semi-conductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1990·Granted Mar 23, 1993·8 cites·4 claims
- 3734US2009044063A1Semiconductor memory device and test system of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 3831US5999031ASemiconductor device with bus line loading compensation circuitSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Dec 7, 1999·1 cites·3 claims
- 3931US5663913ASemiconductor memory device having high speed parallel transmission line operation and a method for forming parallel transmission linesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 2, 1997·1 cites·8 claims
- 4031US2004252689A1Memory system with reduced pin countFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →