Inventor · disambiguated record
Hyoung-Jo Jeon
Also filed as: JEON HYOUNG-JO
11 granted patents·2 pending applications·78 citations·filing 2001–2017
89Inventor score
Top patents by PatentIndex Score
13 records- 0190US9841688B2Method for detecting overlay error and method for manufacturing semiconductor device using the sameKO KANG-WOONG·Filed 2015·Granted Dec 12, 2017·11 cites·20 claims
- 0287US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0383US9267879B2Ellipsometer for detecting surfaceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 23, 2016·5 cites·12 claims
- 0480US6480002B1Battery inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 12, 2002·21 cites·7 claims
- 0576US7110104B2Panel inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 19, 2006·15 cites·21 claims
- 0670US10551326B2Method for measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 4, 2020·2 cites·16 claims
- 0763US6501823B1Method of reconstructing a tomogram of an X-ray apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Dec 31, 2002·5 cites·7 claims
- 0861US7538750B2Method of inspecting a flat panel displaySAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 26, 2009·9 cites·14 claims
- 0947US7193795B2Optical system with image producing surface control unitSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 20, 2007·0 cites·27 claims
- 1046US6830376B2Radioactive image apparatus and focus control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Dec 14, 2004·1 cites·31 claims
- 1143US2004114198A1Image processing system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Application pending·0 cites
- 1240US6415014B1Three-dimensional image constructing method using X-ray apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jul 2, 2002·5 cites·6 claims
- 1334US2018144995A1Optical inspection apparatus and method and method of fabricating semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →