Inventor · disambiguated record
Hyungmin Jin
Also filed as: JIN HYUNGMIN
9 granted patents·1 pending application·14 citations·filing 2021–2025
83Inventor score
Files withSAMSUNG ELECTRONICS CO LTD10
Top patents by PatentIndex Score
10 records- 0195US11693030B2Probe device, test device, and test method for semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 4, 2023·3 cites·20 claims
- 0294US11594267B2Memory device for receiving one clock signal as a multi-level signal and restoring original data encoded into the clock signal and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 28, 2023·5 cites·20 claims
- 0392US11461251B2Memory device supporting a high-efficient input/output interface and a memory system including the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 4, 2022·2 cites·20 claims
- 0490US11789879B2Memory device supporting a high-efficient input/output interface and a memory system including the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 17, 2023·1 cites·20 claims
- 0589US11669448B2Transmitters for generating multi-level signals and memory system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 6, 2023·2 cites·8 claims
- 0684US12321290B2Memory device supporting a high-efficient input/output interface and a memory system including the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Jun 3, 2025·0 cites·20 claims
- 0783US2025265206A1Memory device supporting a high-efficient input/output interface and a memory system including the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0880US12061561B2Memory device supporting a high-efficient input/output interface and a memory system including the memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 13, 2024·0 cites·15 claims
- 0980US11581960B2Translation device, test system including the same, and memory system including the translation deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·1 cites·20 claims
- 1069US11870504B2Translation device, test system including the same, and memory system including the translation deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 9, 2024·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →