Inventor · disambiguated record
Hyo-Cheon Kang
Also filed as: KANG HYO · KANG HYO S · KANG HYO-CHEON
11 granted patents·3 pending applications·62 citations·filing 1999–2014
88Inventor score
Top patents by PatentIndex Score
14 records- 0189US9873622B2Hybrid porous structured material, membrane including the same, and method of preparing hybrid porous structured materialSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jan 23, 2018·12 cites·11 claims
- 0280US8695811B2Hybrid porous structured material, membrane including the same, and method of preparing hybrid porous structure materialKANG HYO·Filed 2012·Granted Apr 15, 2014·6 cites·17 claims
- 0374US10220355B2Compound for fouling resistance, membrane for fouling resistance, and method of preparing membrane for fouling resistanceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 5, 2019·2 cites·18 claims
- 0474US7126357B2Method for inspecting a wafer and apparatus for inspecting a waferSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 24, 2006·4 cites·10 claims
- 0561US6545491B2Apparatus for detecting defects in semiconductor devices and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Apr 8, 2003·11 cites·31 claims
- 0660US6913939B2Method for inspecting a wafer and apparatus for inspecting a waferSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jul 5, 2005·6 cites·22 claims
- 0750US6525318B1Methods of inspecting integrated circuit substrates using electron beamsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Feb 25, 2003·19 cites·20 claims
- 0848US7398178B2Method of determining the irregularities of a holeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 8, 2008·2 cites·19 claims
- 0946US9165354B2Method of analyzing photolithography processesSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Oct 20, 2015·0 cites·19 claims
- 1044US9156009B2Membrane, method for manufacturing the same, and composite membrane including the sameHAN JUNG IM·Filed 2011·Granted Oct 13, 2015·0 cites·16 claims
- 1141US2005207626A1User identification and verification system and method for a mobile terminalLG ELECTRONICS INC·Filed 2005·Application pending·0 cites
- 1238US2006029286A1Image processing methodLIM JUNG-TAEK·Filed 2005·Application pending·0 cites
- 1336US2006285729A1Fingerprint recognition system and methodKIM TAEK S·Filed 2006·Application pending·0 cites
- 1422US6100102AMethod of in-line monitoring for shallow pit on semiconductor substrateSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Aug 8, 2000·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →